ClassID:

209483

H01L2224/03602 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Manufacturing methods by patterning a pre-deposited material Mechanical treatment, e.g. polishing, grinding

Recent Application in this class:
#1
20260053036
2026-02-19

METHOD OF FORMING BONDING CONTACT, BONDING STRUCTURE AND SEMICONDUCTOR DEVICE

#2
20250379165
2025-12-11

MANUFACTURING METHOD OF SEMICONDUCTOR CHIP

#3
20250323125
2025-10-16

SEMICONDUCTOR DEVICE WITH BACKSIDE INTERFACE MECHANISM AND METHODS FOR MANUFACTURING THE SAME

#4
20250022752
2025-01-16

FLAT METAL FEATURES FOR MICROELECTRONICS APPLICATIONS

#5
20230395538
2023-12-07

CHIP PACKAGE WITH HIGHER BEARING CAPACITY IN WIRE BONDING

#6
20230114550
2023-04-13

MANUFACTURING METHOD OF SEMICONDUCTOR CHIP

#7
20220102300
2022-03-31

Semiconductor device and method for manufacturing semiconductor device

#8
20210082754
2021-03-18

Flat metal features for microelectronics applications

#9
20210050316
2021-02-18

Interconnect structure and method of forming same

#10
20200235063
2020-07-23

Three-dimensional integrated circuit and method of manufacturing the same

#11
20190393086
2019-12-26

Flat metal features for microelectronics applications

#12
20190304961
2019-10-03

Packaging process

#13
20180366446
2018-12-20

Ultrathin layer for forming a capacitive interface between joined integrated circuit component

#14
20180350674
2018-12-06

Flat metal features for microelectronics applications

#15
20180145046
2018-05-24

Interconnect structure and method of forming same

#16
20180108626
2018-04-19

Final passivation for wafer level warpage and ULK stress reduction

#17
20180096958
2018-04-05

Method for improving wire bonding strength of an image sensor

#18
20180040577
2018-02-08

Pad structure and manufacturing method thereof

#19
20170372998
2017-12-28

SHEET MOLDING PROCESS FOR WAFER LEVEL PACKAGING

#20
20170271287
2017-09-21

Interconnect structure and method of forming same

#21
20170243910
2017-08-24

Semiconductor device having gaps within the conductive parts

#22
20170194272
2017-07-06

Method of manufacturing a layer structure having partially sealed pores

#23
20160293653
2016-10-06

Semiconductor apparatus, solid state imaging device, imaging apparatus and electronic equipment, and manufacturing method thereof

#24
20160190089
2016-06-30

Wafer to wafer bonding process and structures

#25
20160172299
2016-06-16

Integrated device package comprising photo sensitive fill between a substrate and a die

#26
20160126136
2016-05-05

Semiconductor device having a low-adhesive bond substrate pair

#27
20160118356
2016-04-28

Interconnect structure and method of forming same

#28
20160071817
2016-03-10

Method for bonding metallic contact areas with solution of a sacrificial layer applied on one of the contact areas

#29
20160064356
2016-03-03

Semiconductor device package with organic interposer

#30
20150243612
2015-08-27

Chip parts and method for manufacturing the same, circuit assembly having the chip parts and electronic device

#31
20150228596
2015-08-13

Semiconductor packaging structure and manufacturing method for the same

#32
20150097283
2015-04-09

Plug via formation with grid features in the passivation layer

#33
20150011082
2015-01-08

Conductive structure and method for forming the same

#34
20140342503
2014-11-20

Compliant interconnects in wafers

#35
20130260551
2013-10-03

Semiconductor device and method of forming the same

#36
20130168870
2013-07-04

Method for manufacturing an electronic device by reducing thickness of electronic members attached to a carrier

#37
20130127047
2013-05-23

Conductive structure and method for forming the same

#38
20120326308
2012-12-27

Enhanced WLP for superior temp cycling, drop test and high current applications

#39
20120153498
2012-06-21

Semiconductor device and method of forming the same

#40
20120146210
2012-06-14

Compliant interconnects in wafers

#41
20110227219
2011-09-22

Enhanced WLP for superior temp cycling, drop test and high current applications

#42
20080274610
2008-11-06

Methods of forming a semiconductor device including a diffusion barrier film

#43
20060128134
2006-06-15

Method for re-routing lithography-free microelectronic devices

#44
15292433
2017-09-05

Final passivation for wafer level warpage and ULK stress reduction