ClassID:

207728

H01L23/5226 - page 5 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#1201
20250006590
2025-01-02

DOUBLE-SIDED INTEGRATED CIRCUIT WITH STABILIZING CAGE

#1202
20250006557
2025-01-02

Backside Via and Dual Side Power Rail For Epitaxial Source/Drain Structure

#1203
20250006551
2025-01-02

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

#1204
20240431107
2024-12-26

VERTICAL SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

#1205
20240431099
2024-12-26

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR FORMING THE SAME

#1206
20240429183
2024-12-26

ELECTRONIC DEVICES AND METHODS OF MANUFACTURING ELECTRONIC DEVICES

#1207
20240429169
2024-12-26

THERMAL BUDGET ENHANCED BURIED POWER RAIL AND METHOD OF MANUFACTURING THE SAME

#1208
20240429168
2024-12-26

INTEGRATED CIRCUIT INCLUDING BACKSIDE WIRING AND METHOD OF DESIGNING THE INTEGRATED CIRCUIT

#1209
20240429167
2024-12-26

CIRCUIT CELLS HAVING POWER STUBS

#1210
20240429164
2024-12-26

INTEGRATED CIRCUIT DEVICES WITH FLIPPED STAIRCASE INTERCONNECT STRUCTURES

#1211
20240429163
2024-12-26

SEMICONDUCTOR DEVICE

#1212
20240429161
2024-12-26

STAGGERED VIA ARCHITECTURE ACROSS UNIT CELLS

#1213
20240429158
2024-12-26

SEMICONDUCTOR MEMORY DEVICE

#1214
20240429156
2024-12-26

Embedding Metal-Insulator-Metal Structure In Silicon Oxide In A Copper Redistribution Layer Scheme

#1215
20240429155
2024-12-26

INTEGRATED CAPACITOR

#1216
20240429129
2024-12-26

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#1217
20240429128
2024-12-26

THREE-DIMENSIONAL INTEGRATED CIRCUIT WITH TOP CHIP INCLUDING LOCAL INTERCONNECT FOR BODY-SOURCE COUPLING

#1218
20240429090
2024-12-26

Contact Feature Through Heterogeneous Stacked Film and Methods of Making Same

#1219
20240422983
2024-12-19

SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

#1220
20240422967
2024-12-19

MEMORY DEVICES AND RELATED METHODS

#1221
20240421079
2024-12-19

INTERCONNECT LEVELS WITH MULTIPLE LINE TYPES

#1222
20240421078
2024-12-19

REDUCTION OF MIDDLE-OF-LINE RESISTANCE AND CAPACITANCE

#1223
20240421074
2024-12-19

THIN FILM RESISTOR, THERMISTOR AND METHOD OF PRODUCING THE SAME

#1224
20240421073
2024-12-19

LOCALIZED HIGH DENSITY SUBSTRATE ROUTING

#1225
20240421072
2024-12-19

SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF

#1226
20240421071
2024-12-19

SEMICONDUCTOR MEMORY DEVICE

#1227
20240421070
2024-12-19

SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME

#1228
20240421069
2024-12-19

TIGHT PITCH DIRECTIONAL SELECTIVE VIA GROWTH

#1229
20240421038
2024-12-19

STACKED DEVICES WITH BACKSIDE CONTACTS

#1230
20240421027
2024-12-19

SEMICONDUCTOR PACKAGE STRUCTURE FOR ENHANCED COOLING

#1231
20240421013
2024-12-19

Edge Recess Design for Molded and Fusion or Hybrid Bonded Integrated Circuit

#1232
20240420994
2024-12-19

INTERCONNECT LAYER AND METHOD FOR MANUFACTURING THE SAME

#1233
20240415028
2024-12-12

TUNABLE GROUND CONNECTION TO MAJORANA ZERO MODES

#1234
20240414921
2024-12-12

MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

#1235
20240414912
2024-12-12

SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING THE SAME

#1236
20240414906
2024-12-12

SRAM STRUCTURE WITH DUAL SIDE POWER RAILS

#1237
20240413195
2024-12-12

SEMICONDUCTOR DEVICES WITH A CURRENT GAIN LAYOUT

#1238
20240413158
2024-12-12

SEMICONDUCTOR DEVICE

#1239
20240413151
2024-12-12

SEMICONDUCTOR DEVICE

#1240
20240413144
2024-12-12

SEMICONDUCTOR PACKAGE

#1241
20240413136
2024-12-12

THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE

#1242
20240413087
2024-12-12

Interconnect Structure and Method of Forming Thereof

#1243
20240413082
2024-12-12

METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS

#1244
20240413081
2024-12-12

SEMICONDUCTOR DEVICE

#1245
20240413076
2024-12-12

SEMICONDUCTOR DEVICE INCLUDING A POROUS DIELECTRIC LAYER, AND METHOD OF FORMING THE SEMICONDUCTOR DEVICE

#1246
20240413075
2024-12-12

INTERCONNECT STRUCTURE HAVING HEAT DISSIPATION CAPABILITY AND METHOD FOR MANUFACTURING THE SAME

#1247
20240413074
2024-12-12

INTERCONNECTION STRUCTURE AND METHODS OF FORMING THE SAME

#1248
20240413014
2024-12-12

SEMICONDUCTOR CHIPS AND METHOD OF MANUFACTURING THEREOF

#1249
20240410855
2024-12-12

WAFER-LEVEL PACKAGING OF SOLID-STATE BIOSENSOR, MICROFLUIDICS, AND THROUGH-SILICON VIA

#1250
20240407172
2024-12-05

THROUGH ARRAY CONTACT STRUCTURE OF THREE-DIMENSIONAL MEMORY DEVICE

#1251
20240407167
2024-12-05

THREE-DIMENSIONAL MEMORY DEVICE AND FORMATION METHOD THEREOF

#1252
20240404992
2024-12-05

Multi-Die Package Structures Including Redistribution Layers

#1253
20240404975
2024-12-05

UPPER CONDUCTIVE STRUCTURE HAVING MULTILAYER STACK TO DECREASE FABRICATION COSTS AND INCREASE PERFORMANCE

#1254
20240404965
2024-12-05

SEMICONDUCTOR DEVICE AND METHOD OF MAKING

#1255
20240404952
2024-12-05

FLIP-CHIP SEMICONDUCTOR-ON-INSULATOR TRANSISTOR LAYOUT

#1256
20240404951
2024-12-05

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

#1257
20240404944
2024-12-05

FRONTSIDE TO BACKSIDE CONNECTION WITHIN DOUBLE DIFFUSION BREAK

#1258
20240404942
2024-12-05

HIGH DENSITY BACKSIDE MIM CAPACITOR

#1259
20240404920
2024-12-05

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

#1260
20240404882
2024-12-05

SEMICONDUCTOR DEVICES INCLUDING LOW-K METAL GATE ISOLATION AND METHODS OF FABRICATION THEREOF

#1261
20240404881
2024-12-05

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

#1262
20240404877
2024-12-05

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE

#1263
20240404875
2024-12-05

AIR GAPS IN MEMORY ARRAY STRUCTURES

#1264
20240404863
2024-12-05

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

#1265
20240397728
2024-11-28

FERROELECTRIC MEMORY DEVICE WITH SEMICONDUCTOR LAYER

#1266
20240397724
2024-11-28

PERIPHERAL CIRCUITRY UNDER ARRAY MEMORY DEVICE AND METHOD OF FABRICATING THEREOF

#1267
20240397722
2024-11-28

SEMICONDUCTOR MEMORY

#1268
20240397719
2024-11-28

SEMICONDUCTOR MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME

#1269
20240397715
2024-11-28

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRONIC SYSTEM INCLUDING SEMICONDUCTOR DEVICE

#1270
20240397711
2024-11-28

NONVOLATILE MEMORY UNIT CELL AND ARRAY ARCHITECTURE

#1271
20240396198
2024-11-28

CHIP PACKAGES INCLUDING SUBSTRATE INTEGRATED WAVEGUIDES

#1272
20240395948
2024-11-28

DOUBLE-SIDED STACKED DTC STRUCTURE

#1273
20240395939
2024-11-28

MULTI-LAYER FILM DEVICE AND METHOD

#1274
20240395894
2024-11-28

Molybdenum-Containing Device-Level Interconnects and Methods of Fabrication Thereof

#1275
20240395886
2024-11-28

INTEGRATED CIRCUIT STRUCTURES WITH PARTIAL CHANNEL CAP REMOVAL

#1276
20240395879
2024-11-28

CONTACT INTEGRATION IN COMPLEMENTARY FIELD EFFECT TRANSISTOR (CFET) DEVICES

#1277
20240395787
2024-11-28

INTEGRATED CIRCUIT WITH STACKED INTERPOSER

#1278
20240395781
2024-11-28

SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME

#1279
20240395774
2024-11-28

PACKAGE STRUCTURE AND METHOD OF FORMING THE SAME

#1280
20240395750
2024-11-28

Three-Dimensional Integrated Circuit with Hybrid Bond Metal Structure

#1281
20240395739
2024-11-28

CAVITY RESONATOR FOR ENHANCING RADIO-FREQUENCY PERFORMANCE AND METHODS FOR FORMING THE SAME

#1282
20240395728
2024-11-28

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURE

#1283
20240395716
2024-11-28

METHOD OF MANUFACTURING INTEGRATED CIRCUIT

#1284
20240395710
2024-11-28

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING MULTI-LEVEL BRIDGE SUPPORT STRUCTURES AND METHODS FOR FORMING THE SAME

#1285
20240395707
2024-11-28

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#1286
20240395706
2024-11-28

MEMORY DEVICE

#1287
20240395703
2024-11-28

SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR MEMORY DEVICE

#1288
20240395702
2024-11-28

SEMICONDUCTOR INTERCONNECT STRUCTURE WITH DOUBLE CONDUCTORS

#1289
20240395701
2024-11-28

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#1290
20240395700
2024-11-28

SEMICONDUCTOR INTERCONNECTION STRUCTURES AND METHODS OF FORMING THE SAME

#1291
20240395699
2024-11-28

INTEGRATED CIRCUIT STRUCTURE AND METHOD FOR FORMING THE SAME

#1292
20240395698
2024-11-28

THREE DIMENSIONAL INTEGRATED CIRCUIT AND FABRICATION THEREOF

#1293
20240395697
2024-11-28

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

#1294
20240395693
2024-11-28

INTEGRATED CIRCUIT HAVING STACKED PICK-UP REGIONS

#1295
20240395672
2024-11-28

SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING SAME

#1296
20240395649
2024-11-28

SEMICONDUCTOR DEVICE

#1297
20240395617
2024-11-28

Bl-LAYER ALLOY LINER FOR INTERCONNECT METALLIZATION AND METHODS OF FORMING THE SAME

#1298
20240395612
2024-11-28

CARBON-BASED LINER TO REDUCE CONTACT RESISTANCE

#1299
20240395608
2024-11-28

GLUE LAYER ETCHING FOR IMPROVING DEVICE PERFORMANCE AND PROVIDING CONTACT ISOLATION

#1300
20240395607
2024-11-28

ETCH PROFILE CONTROL OF GATE CONTACT OPENING

#1301
20240395606
2024-11-28

SEMICONDUCTOR DEVICE WITH CONNECTING STRUCTURE HAVING A DOPED LAYER AND METHOD FOR FORMING THE SAME

#1302
20240394459
2024-11-28

METHOD FOR GENERATING A LAYOUT DIAGRAM OF A SEMICONDUCTOR DEVICE INCLUDING POWER-GRID-ADAPTED ROUTE-SPACING

#1303
20240394455
2024-11-28

SEMICONDUCTOR DEVICE, AND METHOD OF FORMING SAME

#1304
20240389358
2024-11-21

METHOD OF FORMING SEMICONDUCTOR DEVICES

#1305
20240389351
2024-11-21

SEMICONDUCTOR CHIP

#1306
20240389346
2024-11-21

SEMICONDUCTOR CHIP AND FABRICATION METHOD THEREOF

#1307
20240389341
2024-11-21

COCKTAIL LAYER OVER GATE DIELECTRIC LAYER OF FET FERAM

#1308
20240389337
2024-11-21

MEMORY DEVICES

#1309
20240389334
2024-11-21

METHODS OF FORMING THREE-DIMENSIONAL MEMORY DEVICES

#1310
20240389300
2024-11-21

THREE-DIMENSIONAL MEMORY ARRAYS WITH LAYER SELECTOR TRANSISTORS

#1311
20240387789
2024-11-21

SEMICONDUCTOR DEVICES

#1312
20240387657
2024-11-21

2D-Channel Transistor Structure with Asymmetric Substrate Contacts

#1313
20240387655
2024-11-21

COMMON RAIL CONTACT

#1314
20240387648
2024-11-21

SEMICONDUCTOR DEVICE

#1315
20240387646
2024-11-21

SEMICONDUCTOR DEVICE AND METHOD

#1316
20240387619
2024-11-21

STACKED CAPACITOR STRUCTURE AND MANUFACTURING METHOD THEREOF

#1317
20240387609
2024-11-21

METAL-INSULATOR-METAL CAPACITORS WITH THICK INTERMEDIATE ELECTRODE LAYERS AND METHODS OF FORMING THE SAME

#1318
20240387555
2024-11-21

MACRO DEVICE-UNDER-TEST STRUCTURE FOR MEASURING CONTACT RESISTANCE OF SEMICONDUCTOR DEVICE

#1319
20240387547
2024-11-21

TIE OFF DEVICE

#1320
20240387524
2024-11-21

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#1321
20240387516
2024-11-21

VOLTAGE REGULATOR HAVING VARIABLE OUTPUT CAPACITANCE AND METHODS FOR FORMING THE SAME

#1322
20240387505
2024-11-21

INTEGRATED CIRCUIT DEVICE MANUFACTURING METHOD

#1323
20240387498
2024-11-21

MANUFACTURING METHOD OF SEMICONDUCTOR PACKAGE WITH THERMAL RELAXATION BLOCK

#1324
20240387458
2024-11-21

Three-Dimensional Vertical Interconnect Architecture and Methods For Forming

#1325
20240387418
2024-11-21

SEMICONDUCTOR DEVICE

#1326
20240387411
2024-11-21

DELAMINATION SENSOR

#1327
20240387384
2024-11-21

FORMING DIELECTRIC FILM WITH HIGH RESISTANCE TO TILTING

#1328
20240387382
2024-11-21

LOW-RESISTANCE COPPER INTERCONNECTS

#1329
20240387381
2024-11-21

SEMICONDUCTOR DEVICES AND METHODS OF FORMATION

#1330
20240387380
2024-11-21

REDISTRIBUTION LAYER FEATURES

#1331
20240387378
2024-11-21

SEMICONDUCTOR DEVICES WITH INTEGRATED PASSIVE DEVICES AND METHODS OF MANUFACTURE

#1332
20240387377
2024-11-21

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

#1333
20240387375
2024-11-21

SEMICONDUCTOR DEVICE, AND ASSOCIATED METHOD AND SYSTEM

#1334
20240387374
2024-11-21

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING ETCH STOP METAL PLATES FOR BACKSIDE VIA STRUCTURES AND METHODS FOR FORMING THE SAME

#1335
20240387373
2024-11-21

Integrated Circuit Having a High Cell Density

#1336
20240387370
2024-11-21

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING OVERLYING THIN FILM TRANSISTOR CONTROL CIRCUIT AND METHOD OF MAKING THEREOF

#1337
20240387369
2024-11-21

MIDDLE-END-OF-LINE STRAP FOR STANDARD CELL

#1338
20240387367
2024-11-21

METHOD OF MANUFACTURING ELECTRONIC APPARATUS

#1339
20240387361
2024-11-21

INTEGRATED CIRCUIT INCLUDING SUPERVIA AND METHOD OF MAKING

#1340
20240387360
2024-11-21

Interconnect Structure of Semiconductor Device and Method of Forming Same

#1341
20240387359
2024-11-21

SEMICONDUCTOR PACKAGES AND METHODS OF FORMING THE SAME

#1342
20240387358
2024-11-21

METHODS FOR MANUFACTURING AN INTERCONNECT STRUCTURE

#1343
20240387357
2024-11-21

SEMICONDUCTOR INTERCONNECT STRUCTURE WITH BOTTOM SELF-ALIGNED VIA LANDING

#1344
20240387356
2024-11-21

SEMICONDUCTOR DEVICE WITH CONTACT STRUCTURE

#1345
20240387355
2024-11-21

CAPACITOR FORMED WITH HIGH RESISTANCE LAYER AND METHOD OF MANUFACTURING SAME

#1346
20240387354
2024-11-21

SEMICONDUCTOR ARRANGEMENT AND METHOD OF MAKING

#1347
20240387331
2024-11-21

Through-Circuit Vias In Interconnect Structures

#1348
20240387316
2024-11-21

SEMICONDUCTOR ARRANGEMENT AND METHOD OF FORMING

#1349
20240387303
2024-11-21

SYSTEMS AND METHODS OF TESTING MEMORY DEVICES

#1350
20240387263
2024-11-21

Via for Component Electrode Connection

#1351
20240387261
2024-11-21

GATE CONTACT STRUCTURE

#1352
20240387259
2024-11-21

CONDUCTIVE STRUCTURES WITH BARRIERS AND LINERS OF VARYING THICKNESSES

#1353
20240387256
2024-11-21

RUTHENIUM-BASED LINER FOR A COPPER INTERCONNECT

#1354
20240387254
2024-11-21

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

#1355
20240387252
2024-11-21

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

#1356
20240387251
2024-11-21

INTERCONNECT STRUCTURE AND METHODS OF FORMING THE SAME

#1357
20240387249
2024-11-21

Spacers for Semiconductor Devices Including Backside Power Rails

#1358
20240387248
2024-11-21

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURE

#1359
20240387185
2024-11-21

BY-SITE-COMENSATED ETCH BACK FOR LOCAL PLANARIZATION/TOPOGRAPHY ADJUSTMENT

#1360
20240386959
2024-11-21

THREE-DIMENSIONAL MEMORY DEVICE INCLUDING TRENCH BRIDGE STRUCTURES HAVING DIFFERENT VOLUMES AND METHODS OF FORMING THE SAME

#1361
20240386943
2024-11-21

SCALED 2T DRAM

#1362
20240386932
2024-11-21

Structure and Method for MRAM Devices with a Slot Via

#1363
20240384408
2024-11-21

APPARATUS AND METHOD OF MANUFACTURING INTERCONNECT STRUCTURES

#1364
20240381640
2024-11-14

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#1365
20240379774
2024-11-14

METHOD OF FORMING CONTACT STRUCTURES

#1366
20240379744
2024-11-14

DIELECTRIC FINS WITH AIR GAP AND BACKSIDE SELF-ALIGNED CONTACT

#1367
20240379623
2024-11-14

SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR FORMING THE SAME

#1368
20240379605
2024-11-14

HYBRID MICRO-BUMP INTEGRATION WITH REDISTRIBUTION LAYER

#1369
20240379604
2024-11-14

SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME

#1370
20240379601
2024-11-14

INTEGRATED CIRCUIT PACKAGES AND METHODS OF FORMING THE SAME

#1371
20240379585
2024-11-14

SEMICONDUCTOR ARRANGEMENT AND METHOD OF MAKING

#1372
20240379584
2024-11-14

SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

#1373
20240379563
2024-11-14

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES

#1374
20240379560
2024-11-14

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

#1375
20240379559
2024-11-14

GRAPHENE-ASSISTED LOW-RESISTANCE INTERCONNECT STRUCTURES AND METHODS OF FORMATION THEREOF

#1376
20240379555
2024-11-14

METHODS FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

#1377
20240379554
2024-11-14

BACK SIDE SIGNAL ROUTING IN A CIRCUIT WITH A RELAY CELL

#1378
20240379553
2024-11-14

3D SEMICONDUCTOR DEVICE AND STRUCTURE WITH METAL LAYERS

#1379
20240379552
2024-11-14

LAYOUTS FOR CONDUCTIVE LAYERS IN INTEGRATED CIRCUITS

#1380
20240379547
2024-11-14

SEMICONDUCTOR DEVICE

#1381
20240379546
2024-11-14

Via Structures

#1382
20240379541
2024-11-14

Nitrogen Plasma Treatment For Improving Interface Between Etch Stop Layer And Copper Interconnect

#1383
20240379540
2024-11-14

INTERCONNECT STRUCTURE AND METHOD OF FORMING THE SAME

#1384
20240379539
2024-11-14

INTERCONNECT STRUCTURES

#1385
20240379538
2024-11-14

Semiconductor Device and Method of Manufacture

#1386
20240379537
2024-11-14

SEMICONDUCTOR STRUCTURE HAVING DEEP METAL LINE AND METHOD FOR FORMING THE SEMICONDUCTOR STRUCTURE

#1387
20240379536
2024-11-14

METHOD OF FORMING PACKAGE STRUCTURE

#1388
20240379535
2024-11-14

SEMICONDUCTOR PACKAGES AND METHODS OF FORMING SAME

#1389
20240379534
2024-11-14

ELECTRONIC PACKAGE, MANUFACTURING METHOD FOR THE SAME, AND ELECTRONIC STRUCTURE

#1390
20240379533
2024-11-14

INTEGRATION OF VIA AND BOTTOM ELECTRODE FOR MEMORY CELL

#1391
20240379532
2024-11-14

NOVEL MIM STRUCTURE

#1392
20240379530
2024-11-14

INTERCONNECT STRUCTURE AND METHODS OF FORMING THE SAME

#1393
20240379527
2024-11-14

INTEGRATED CHIP HAVING A BACK-SIDE POWER RAIL

#1394
20240379500
2024-11-14

THROUGH SUBSTRATE VIA LANDING ON FRONT END OF LINE STRUCTURE

#1395
20240379497
2024-11-14

MEMORIES AND FABRICATION METHODS THEREOF, MEMORY SYSTEMS, AND ELECTRONIC DEVICES

#1396
20240379482
2024-11-14

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#1397
20240379460
2024-11-14

INTERCONNECT STRUCTURE FOR FIN-LIKE FIELD EFFECT TRANSISTOR

#1398
20240379437
2024-11-14

SEMICONDUCTOR STRUCTURE

#1399
20240379436
2024-11-14

SELF-ALIGNED INTERCONNECT STRUCTURE AND METHOD OF FORMING THE SAME

#1400
20240379435
2024-11-14

SEMICONDUCTOR STRUCTURE HAVING SELF-ALIGNED CONDUCTIVE STRUCTURE AND METHOD FOR FORMING THE SEMICONDUCTOR STRUCTURE

#1401
20240379434
2024-11-14

Fully Self-Aligned Interconnect Structure

#1402
20240379430
2024-11-14

INTERCONNECT STRUCTURE INCLUDING GRAPHITE AND METHOD FORMING SAME

#1403
20240379425
2024-11-14

CONDUCTIVE FEATURE OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

#1404
20240379424
2024-11-14

METHOD OF MAKING HIGH ASPECT RATIO OPENINGS IN A SEMICONDUCTOR DEVICE USING ION IMPLANTATED REGROWN CLADDING MASK

#1405
20240379422
2024-11-14

FIELD EFFECT TRANSISTOR WITH MULTI-METAL GATE VIA AND METHOD

#1406
20240379421
2024-11-14

SLURRY COMPOSITION, SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

#1407
20240379419
2024-11-14

SEMICONDUCTOR STRUCTURE HAVING SEAM SEALED

#1408
20240379415
2024-11-14

CONTACT FOR ELECTRONIC COMPONENT

#1409
20240379414
2024-11-14

AIR SPACER SURROUNDING CONDUCTIVE FEATURES AND METHOD FORMING SAME

#1410
20240379413
2024-11-14

INTERCONNECT STRUCTURE AND METHODS OF FORMING THE SAME

#1411
20240379412
2024-11-14

HOMOGENEOUS SOURCE/DRAIN CONTACT STRUCTURE

#1412
20240379409
2024-11-14

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

#1413
20240379379
2024-11-14

PIT-LESS CHEMICAL MECHANICAL PLANARIZATION PROCESS AND DEVICE STRUCTURES MADE THEREFROM

#1414
20240378365
2024-11-14

ROUTING STRUCTURE OF SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF

#1415
20240373643
2024-11-07

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF MANUFACTURING THEREOF

#1416
20240373641
2024-11-07

CAPPING LAYER OVER FET FERAM TO INCREASE CHARGE MOBILITY

#1417
20240373639
2024-11-07

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING PERIPHERAL CIRCUIT WITH FIN FIELD EFFECT TRANSISTORS AND METHOD OF MAKING THE SAME

#1418
20240373629
2024-11-07

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

#1419
20240373628
2024-11-07

STRAP-CELL ARCHITECTURE FOR EMBEDDED MEMORY

#1420
20240372013
2024-11-07

SEMICONDUCTOR DEVICE INCLUDING DEEP TRENCH CAPACITORS AND VIA CONTACTS

#1421
20240371998
2024-11-07

CONTACT STRUCTURE WITH INSULATING CAP AND METHOD FOR FORMING THE SAME

#1422
20240371948
2024-11-07

Back-End-Of-Line Devices

#1423
20240371925
2024-11-07

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

#1424
20240371922
2024-11-07

SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME

#1425
20240371918
2024-11-07

METHOD (AND RELATED APPARATUS) FOR FORMING A RESISTOR OVER A SEMICONDUCTOR SUBSTRATE

#1426
20240371861
2024-11-07

SEMICONDUCTOR DEVICE INCLUDING VERTICAL ROUTING STRUCTURE AND METHOD FOR MANUFACURING THE SAME

#1427
20240371857
2024-11-07

SEMICONDUCTOR DEVICE STRUCTURE WITH FUSE AND RESISTOR AND METHOD FOR PREPARING THE SAME

#1428
20240371856
2024-11-07

SEMICONDUCTOR DEVICE STRUCTURE WITH FUSE AND RESISTOR AND METHOD FOR PREPARING THE SAME

#1429
20240371769
2024-11-07

SEMICONDUCTOR DEVICE HAVING AN EXTRA LOW-K DIELECTRIC LAYER AND METHOD OF FORMING THE SAME

#1430
20240371768
2024-11-07

INTEGRATED CIRCUIT, SYSTEM AND METHOD OF FORMING THE SAME

#1431
20240371767
2024-11-07

SEMICONDUCTOR DEVICE

#1432
20240371765
2024-11-07

DIFFERENT SCALING RATIO IN FEOL / MOL/ BEOL

#1433
20240371764
2024-11-07

SEMICONDUCTOR INTERCONNECTION STRUCTURE AND METHODS OF FORMING THE SAME

#1434
20240371761
2024-11-07

THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THEREOF USING ION IMPLANTED ETCH STOP LAYER ON A SACRIFICIAL FILL MATERIAL

#1435
20240371760
2024-11-07

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING PERIPHERAL CIRCUIT WITH FIN AND PLANAR FIELD EFFECT TRANSISTORS AND METHOD OF MAKING THEREOF

#1436
20240371758
2024-11-07

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

#1437
20240371757
2024-11-07

STRUCTURE AND METHOD OF FORMING A SEMICONDUCTOR DEVICE WITH RESISTIVE ELEMENTS

#1438
20240371756
2024-11-07

SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING THE SAME

#1439
20240371755
2024-11-07

LOW COST THREE-DIMENSIONAL STACKING SEMICONDUCTOR ASSEMBLIES

#1440
20240371754
2024-11-07

Semiconductor Structure

#1441
20240371753
2024-11-07

SOURCE/DRAIN ISOLATION STRUCTURE AND LAYOUT METHOD

#1442
20240371752
2024-11-07

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

#1443
20240371751
2024-11-07

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#1444
20240371750
2024-11-07

SEMICONDUCTOR STRUCTURE WITH TOP VIA HAVING EXTENDED BOTTOM CONTACT

#1445
20240371709
2024-11-07

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

#1446
20240371694
2024-11-07

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#1447
20240371692
2024-11-07

SEMICONDUCTOR STRUCTURE WITH DIELECTRIC FEATURE

#1448
20240371690
2024-11-07

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

#1449
20240371689
2024-11-07

TRANSISTOR GATE CONTACTS

#1450
20240371688
2024-11-07

SEMICONDUCTOR DEVICE WITH DOPED REGION DIELECTRIC LAYER

#1451
20240371687
2024-11-07

VIA-FIRST PROCESS FOR CONNECTING A CONTACT AND A GATE ELECTRODE

#1452
20240371653
2024-11-07

LANDING METAL ETCH PROCESS FOR IMPROVED OVERLAY CONTROL

#1453
20240371443
2024-11-07

MEMORY DEVICE AND METHOD FOR FORMING THE SAME

#1454
20240370045
2024-11-07

DIGITAL LOW-DROPOUT VOLTAGE REGULATOR

#1455
20240365680
2024-10-31

THREE-STATE MEMORY DEVICE

#1456
20240365675
2024-10-31

MRAM WITH ASYMMETRIC STRUCTURE

#1457
20240365526
2024-10-31

Cell Manufacturing

#1458
20240363709
2024-10-31

SEMICONDUCTOR STRUCTURE HAVING SOURCE/DRAIN CONTACTS AND METHOD OF FABRICATING THEREOF

#1459
20240363705
2024-10-31

SEMICONDUCTOR DEVICES WITH BACKSIDE VIA AND METHODS THEREOF

#1460
20240363677
2024-10-31

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD FOR THE SAME

#1461
20240363616
2024-10-31

MEMORY ARRAY CIRCUIT AND METHOD OF MANUFACTURING SAME

#1462
20240363615
2024-10-31

INTEGRATED CIRCUIT DEVICE AND INTEGRATED CIRCUIT LAYOUT

#1463
20240363610
2024-10-31

HYBRID INTEGRATED CIRCUIT PACKAGES

#1464
20240363590
2024-10-31

DIE STACKS AND METHODS FORMING SAME

#1465
20240363589
2024-10-31

METHOD OF FABRICATING STACKED DIE STRUCTURE

#1466
20240363569
2024-10-31

BUMP INTEGRATION WITH REDISTRIBUTION LAYER

#1467
20240363548
2024-10-31

WAFER HAVING TRENCHES

#1468
20240363542
2024-10-31

SEMICONDUCTOR PACKAGE

#1469
20240363538
2024-10-31

SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME

#1470
20240363537
2024-10-31

INTEGRATED CIRCUITS AND METHODS FOR POWER DELIVERY

#1471
20240363534
2024-10-31

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

#1472
20240363532
2024-10-31

INTEGRATED CIRCUIT INCLUDING BACKSIDE CONTACT AND METHOD OF DESIGNING THE INTEGRATED CIRCUIT

#1473
20240363528
2024-10-31

SEMICONDUCTOR STRUCTURE HAVING DIELECTRIC-ON-DIELECTRIC STRUCTURE AND METHOD FOR FORMING THE SEMICONDUCTOR STRUCTURE

#1474
20240363527
2024-10-31

SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF

#1475
20240363526
2024-10-31

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#1476
20240363525
2024-10-31

BACK-END-OF-LINE CMOS INVERTER HAVING REDUCED SIZE AND REDUCED SHORT-CHANNEL EFFECTS AND METHODS OF FORMING THE SAME

#1477
20240363524
2024-10-31

GOUGED INTERCONNECT LINE

#1478
20240363523
2024-10-31

INTEGRATED CIRCUIT STRUCTURE OF CAPACITIVE DEVICE

#1479
20240363494
2024-10-31

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE SAME

#1480
20240363492
2024-10-31

SEMICONDUCTOR DEVICE HAVING THROUGH VIA AND METHOD OF FABRICATING THEREOF

#1481
20240363486
2024-10-31

INTEGRATED CIRCUIT PACKAGES HAVING MECHANICAL BRACE STANDOFFS

#1482
20240363464
2024-10-31

PACKAGE STRUCTURE

#1483
20240363457
2024-10-31

Seal Ring Structure with Zigzag Patterns and Method Forming Same

#1484
20240363429
2024-10-31

PREVENTION OF CONTACT BOTTOM VOID IN SEMICONDUCTOR FABRICATION

#1485
20240363404
2024-10-31

ION IMPLANT PROCESS FOR DEFECT ELIMINATION IN METAL LAYER PLANARIZATION

#1486
20240363403
2024-10-31

SELECTIVE DEPOSITION OF METAL BARRIER IN DAMASCENE PROCESSES

#1487
20240363402
2024-10-31

INTERCONNECT STRUCTURE AND METHOD

#1488
20240363400
2024-10-31

SEMICONDUCTOR DEVICE HAVING METALLIZATION LAYER WITH LOW CAPACITANCE AND METHOD FOR MANUFACTURING THE SAME

#1489
20240363399
2024-10-31

REDUCING SPACING BETWEEN CONDUCTIVE FEATURES THROUGH IMPLANTATION

#1490
20240363366
2024-10-31

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING

#1491
20240363165
2024-10-31

THREE-DIMENSIONAL MEMORY DEVICE INCLUDING A MID-STACK SOURCE LAYER AND METHODS FOR FORMING THE SAME

#1492
20240362394
2024-10-31

INTEGRATED CIRCUIT, SYSTEM FOR AND METHOD OF FORMING AN INTEGRATED CIRCUIT

#1493
20240362390
2024-10-31

SEMICONDUCTOR DEVICE INCLUDING COMBINATION ROWS

#1494
20240360549
2024-10-31

LOW-TEMPERATURE DEPOSITION PROCESSES TO FORM MOLYBDENUM-BASED MATERIALS WITH IMPROVED RESISTIVITY

#1495
20240360264
2024-10-31

CHEMICAL COMPOSITIONS & METHODS OF PATTERNING MICROELECTRONIC DEVICE STRUCTURES

#1496
20240357826
2024-10-24

METHOD OF FORMING MEMORY DEVICE

#1497
20240357821
2024-10-24

VERTICAL MEMORY STUCTURE WITH AIR GAPS AND METHOD FOR PREPARING THE SAME

#1498
20240357819
2024-10-24

Integrated Structures Comprising Vertical Channel Material and Having Conductively-Doped Semiconductor Material Directly Against Lower Sidewalls of the Channel Material, and Methods of Forming Integrated Structures

#1499
20240357806
2024-10-24

SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

#1500
20240357788
2024-10-24

MEMORY ARRAY CIRCUIT AND METHOD OF MANUFACTURING SAME