ClassID:

208095

H01L27/14825 - CPC Classification

Classification description:

Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Devices controlled by radiation; Imager structures; Charge coupled imagers Linear CCD imagers

Recent Application in this class:
#1
20240363672
2024-10-31

Vertically stacked light sensors

#2
20240044703
2024-02-08

Integrated circuit with sequentially-coupled charge storage and associated techniques

#3
20230349755
2023-11-02

Integrated circuit with sequentially-coupled charge storage and associated techniques

#4
20220128403
2022-04-28

Integrated circuit with sequentially-coupled charge storage and associated techniques comprising a photodetection region and charge storage regions to induce an intrinsic electric field

#5
20220128402
2022-04-28

Integrated circuit with sequentially-coupled charge storage and associated techniques

#6
20220120684
2022-04-21

Waveguide integration with optical coupling structures on light detection device

#7
20200304738
2020-09-24

Solid-state image pickup device and control method of solid-state image pickup device

#8
20200273903
2020-08-27

Solid-state imaging device

#9
20200083279
2020-03-12

Imaging device

#10
20190313044
2019-10-10

Multiple column per channel CCD sensor architecture for inspection and metrology

#11
20190253652
2019-08-15

Dual-column-parallel CCD sensor and inspection systems using a sensor

#12
20180284273
2018-10-04

Optoelectronic modules for the acquisition of spectral and distance data

#13
20170301722
2017-10-19

Backside incidence type solid-state image pickup device

#14
20170295334
2017-10-12

Dual-column-parallel CCD sensor and inspection systems using a sensor

#15
20170237877
2017-08-17

Image reading apparatus and semiconductor device

#16
20160315114
2016-10-27

Image sensor, an inspection system and a method of inspecting an article

#17
20160286147
2016-09-29

Charge-coupled device, manufacturing method thereof, and solid-state imaging element

#18
20160268334
2016-09-15

Linear image sensor

#19
20150260659
2015-09-17

Image sensor, an inspection system and a method of inspecting an article

#20
20150187923
2015-07-02

Semiconductor element and solid-state imaging device

#21
20150123174
2015-05-07

Matrix image sensor providing bidirectional charge transfer with asymmetric gates

#22
20140217476
2014-08-07

TDI-type linear image sensor

#23
20140124649
2014-05-08

Off-axial three-mirror system

#24
20110114821
2011-05-19

3D CCD-style imaging sensor with rolling readout

#25
20110075005
2011-03-31

Solid-state imaging device having photoelectric converting portions and first and second transfer portions

#26
20110024607
2011-02-03

Solid-state imaging device

#27
20100321552
2010-12-23

Image sensor and image-reading device

#28
20100201861
2010-08-12

Charge detection device and charge detection method, solid-state imaging device and driving method thereof, and imaging device

#29
20070131974
2007-06-14

Solid-state imaging device

#30
20070045669
2007-03-01

Image sensor

#31
20060214194
2006-09-28

Charge coupled device having diverged channel

#32
20060146163
2006-07-06

Color linear image sensor

#33
20060071321
2006-04-06

Resin molded semiconductor device and mold

#34
20050270595
2005-12-08

Solid image pickup apparatus

#35
20050247857
2005-11-10

Solid-state imaging device and CCD linear sensor

#36
20050225663
2005-10-13

Linear image sensor

#37
15403978
2018-02-27

EMCCD image sensor with stable charge multiplication gain