ClassID:

208099

H01L27/1485 - CPC Classification

Classification description:

Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Devices controlled by radiation; Imager structures; Charge coupled imagers; Area CCD imagers Frame transfer

Recent Application in this class:
#1
20240113146
2024-04-04

Imaging system with selective readout for visible-infrared image capture

#2
20200013758
2020-01-09

Semiconductor device and manufacturing method thereof

#3
20190289233
2019-09-19

Solid-state imaging device and imaging system with a plurality of electrodes sequentially becoming a lowest potential relative to charges of the plurality of electrodes

#4
20170373042
2017-12-28

Semiconductor device and manufacturing method thereof

#5
20170230598
2017-08-10

Solid-state imaging device, method for producing solid-state imaging device, and electronic apparatus using photoelectric conversion elements

#6
20170162625
2017-06-08

Solid-state imaging device, method for producing solid-state imaging device, and electronic apparatus

#7
20150187923
2015-07-02

Semiconductor element and solid-state imaging device

#8
20120256287
2012-10-11

Back-illuminated solid-state image pickup device

#9
20120168892
2012-07-05

Lateral overflow drain and channel stop regions in image sensors

#10
20120119066
2012-05-17

CCD

#11
20120112247
2012-05-10

IMAGE SENSOR FOR IMAGING AT A VERY LOW LEVEL OF LIGHT

#12
20120006971
2012-01-12

Multi-layer sensor chip assembly and method for imaging generating image data with a frame-sum mode and a time-delay integration mode

#13
20110186913
2011-08-04

Solid state image device having a pair of overflow drains extends along the electron transfer direction at a boundary between channel region and channel stop isolation regions of the multiplication register

#14
20110024854
2011-02-03

Solid-state image sensing device containing electron multiplication function having N-type floating diffusion (FD) region formed within a P-type well region

#15
20100270459
2010-10-28

Image sensors with photo-current mode and solar cell operation

#16
20100258847
2010-10-14

Charge coupled device with potential gradient region between two control gate regions

#17
20100245640
2010-09-30

CCD imaging array with extended dynamic range

#18
20100140729
2010-06-10

Method of forming lateral overflow drain and channel stop regions in image sensors

#19
20100140728
2010-06-10

Lateral overflow drain and channel stop regions in image sensors

#20
20100097506
2010-04-22

Image pickup device, spatial information detecting apparatus using the same device and method for taking out received-light output from the same device

#21
20100085460
2010-04-08

Device and method for processing photographic image data

#22
20090303377
2009-12-10

Image sensors with improved angle response

#23
20090020788
2009-01-22

Method of improving solid-state image sensor sensitivity

#24
20090008553
2009-01-08

Variable aperture sensor

#25
20080303933
2008-12-11

Solid-state image pickup apparatus, image pickup apparatus, and image sensor

#26
20080192882
2008-08-14

Semiconductor charge multiplication amplifier device and semiconductor image sensor provided with such an amplifier device

#27
20080029690
2008-02-07

Photodetector, spatial information detecting device using the photodetector, and photo detection method

#28
20080023729
2008-01-31

Solid-state image sensor

#29
20080007622
2008-01-10

Method of improving solid-state image sensor sensitivity

#30
20070291149
2007-12-20

Image sensor, and image pickup apparatus using same, and manufacturing method for manufacturing image sensor

#31
20070214200
2007-09-13

Gain calibration in EMCCD cameras

#32
20070205488
2007-09-06

Light-detecting device and manufacturing method thereof

#33
20070146539
2007-06-28

Spatial information detecting device

#34
20070146521
2007-06-28

Gain measurement structure

#35
20070058063
2007-03-15

Solid state image pickup apparatus having floating diffusion amplifiers for CCD charges

#36
20070051985
2007-03-08

Charge coupled device with high quantum efficiency

#37
20070023787
2007-02-01

Drive unit for charge coupled devices and driving method for charge coupled devices

#38
20070002149
2007-01-04

Solid-state image sensor having control cells for developing signals for image-shooting control under poor illumination

#39
20060238635
2006-10-26

Method of amplifying charge in an imager

#40
20060237751
2006-10-26

Image pickup device having a light shield element

#41
20060220070
2006-10-05

Imaging system and driving method

#42
20060170007
2006-08-03

Solid-state image sensor

#43
20060081956
2006-04-20

Solid-state image sensor

#44
20060076581
2006-04-13

Solid-state image sensor

#45
20060044432
2006-03-02

Fast flush structure for solid-state image sensors

#46
20050230705
2005-10-20

Thz detection employing modulation doped quantum well device structures

#47
20050206758
2005-09-22

Image sensing device employing CCD pixel compression technique and method for driving the same

#48
20050200711
2005-09-15

Solid state imaging device and manufacturing method thereof

#49
20050151169
2005-07-14

Solid-state imaging device and solid-state imaging device array

#50
20050133690
2005-06-23

Color image capture element and color image signal processing circuit

#51
20050056771
2005-03-17

Low noise charge gain circuit and CCD using same

#52
20050040440
2005-02-24

Photo-electric converting device and its driving method, and its manufacturing method, solid-state image pickup device and its driving method and its manufacturing method

#53
20050029553
2005-02-10

Clocked barrier virtual phase charge coupled device image sensor