ClassID:

208203

H01L28/87 - page 2 - CPC Classification

Classification description:

Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor; Capacitors; Electrodes with an enlarged surface, e.g. formed by texturisation having horizontal extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers

Recent Application in this class:
#301
20060071297
2006-04-06

Device with integrated capacitance structure

#302
20050275104
2005-12-15

Method of forming a semiconductor device having air gaps and the structure so formed

#303
20050269598
2005-12-08

Silicon barrier capacitor device structure

#304
20050266652
2005-12-01

High density MIMCAP with a unit repeatable structure

#305
20050259380
2005-11-24

Enhanced on-chip decoupling capacitors and method of making same

#306
20050116278
2005-06-02

Capacitor for semiconductor device and method of forming the same

#307
20050063134
2005-03-24

On-chip bypass capacitor and method of manufacturing the same

#308
20050030700
2005-02-10

Capacitor element, semiconductor integrated circuit and method of manufacturing those

#309
18444455
2024-11-26

Stacked staggered electrode foil capacitor structures in semiconductor devices for single and multi-voltage domain applications and method of fabrication

#310
16940727
2022-10-11

Decoupling capacitor integrated in system on chip (SOC) device

#311
15993977
2019-10-29

Multilayer buried metal-insultor-metal capacitor structures

#312
15938350
2019-05-14

MIM capacitor, semiconductor structure including MIM capacitors and method for manufacturing the same

#313
15488108
2018-07-17

Compound semiconductor transistor integration with high density capacitor

#314
15428678
2018-06-05

Metal-insulator-metal (MIM) capacitor structure and method for forming the same

#315
15339183
2018-01-23

High-K metal-insulator-metal capacitor and method of manufacturing the same

#316
15088045
2017-07-04

Capacitor structure of integrated circuit chip and method of fabricating the same