ClassID:

208288

H01L29/2006 - CPC Classification

Classification description:

Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AB compounds Amorphous materials

Recent Application in this class:
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SEMICONDUCTOR DEVICE

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2024-07-18

AMORPHOUS BORON NITRIDE FILM, SEMICONDUCTOR DEVICE AND FIELD EFFECT TRANSISTOR INCLUDING SAME, AND METHOD OF MANUFACTURING BORON NITRIDE FILM

#3
20230268430
2023-08-24

Semiconductor device including different nitride regions improving characteristics of the semiconductor device

#4
20230068711
2023-03-02

Semiconductor device

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20230061811
2023-03-02

Semiconductor device including compound and nitride members

#6
20230025093
2023-01-26

Semiconductor device

#7
20210384337
2021-12-09

Semiconductor device including different nitride regions and method for manufacturing same

#8
20210265503
2021-08-26

Semiconductor device with a fin-shaped active region and a gate electrode

#9
20210184007
2021-06-17

Semiconductor device

#10
20200295169
2020-09-17

Semiconductor device including different nitride regions and method for manufacturing same

#11
20200220003
2020-07-09

Semiconductor device

#12
20200168703
2020-05-28

Nanowire transistors with embedded dielectric spacers

#13
20200006385
2020-01-02

Semiconductor-on-insulator (SOI) substrate comprising a trap-rich layer with small grain sizes

#14
20190273159
2019-09-05

Semiconductor device with a fin-shaped active region and a gate electrode

#15
20190229192
2019-07-25

Semiconductor device and method for manufacturing semiconductor device

#16
20180144930
2018-05-24

Amorphous boron nitride dielectric

#17
20170365464
2017-12-21

Compound semiconductor substrate and method of forming a compound semiconductor substrate

#18
20170213913
2017-07-27

Semiconductor device having a fin-shaped active region and a gate electrode

#19
20160351698
2016-12-01

Crystalline-amorphous transition material for semiconductor devices and method for formation

#20
20160225913
2016-08-04

InGaAIN-based semiconductor device

#21
20160197076
2016-07-07

Field-effect transistor and semiconductor device

#22
20140001478
2014-01-02

Group III-nitride transistor using a regrown structure

#23
20130026495
2013-01-31

III-nitride metal insulator semiconductor field effect transistor

#24
20100311229
2010-12-09

Amorphous group III-V semiconductor material and preparation thereof

#25
20060043506
2006-03-02

Boron phoshide-based compound semiconductor device, production method thereof and light-emitting diode

#26
14469187
2015-06-16

III-Nitride metal-insulator-semiconductor field-effect transistor

#27
14329759
2015-07-21

Method of forming a stacked low temperature transistor and related devices