ClassID:

212120

H01L2924/01205 - CPC Classification

Classification description:

Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by; Semiconductor purity grades 5N purity grades, i.e. 99.999%

Recent Application in this class:
#1
20190013290
2019-01-10

Wire bonding systems and related methods

#2
20180005981
2018-01-04

Semiconductor device

#3
20160160368
2016-06-09

Method of producing low alpha-ray emitting bismuth, and low alpha-ray emitting bismuth

#4
20130042949
2013-02-21

METHOD OF MANUFACTURING SOFT-DILUTE-COPPER-ALLOY-MATERIAL

#5
20130022831
2013-01-24

SOFT DILUTE COPPER ALLOY WIRE, SOFT DILUTE COPPER ALLOY PLATE AND SOFT DILUTE COPPER ALLOY STRANDED WIRE

#6
20120263624
2012-10-18

Ag—Au—Pd ternary alloy bonding wire

#7
20120168927
2012-07-05

Semiconductor device

#8
20120164795
2012-06-28

Ultrasonic wire bonding method for a semiconductor device

#9
20110236697
2011-09-29

ALUMINUM FOR ULTRASONIC BONDING

#10
20110120594
2011-05-26

Bonding wire for semiconductor

#11
20110104510
2011-05-05

Bonding structure of bonding wire

#12
20110089549
2011-04-21

SEMICONDUCTOR DEVICE

#13
20110011618
2011-01-20

Copper alloy bonding wire for semiconductor device

#14
20100226816
2010-09-09

Gold alloy wire for ball bonding

#15
20100200981
2010-08-12

SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME

#16
20100200969
2010-08-12

Wirebonded semiconductor package

#17
20090272466
2009-11-05

Ultrahigh-Purity Copper and Process for Producing the Same, and Bonding Wire Comprising Ultrahigh-Purity Copper

#18
20090232695
2009-09-17

GOLD ALLOY WIRE FOR BONDING WIRE HAVING HIGH INITIAL BONDABILITY, HIGH BONDING RELIABILITY, HIGH ROUNDNESS OF COMPRESSION BALL, HIGH STRAIGHTNESS, HIGH RESIN FLOWABILITY RESISTANCE, AND LOW SPECIFIC RESISTANCE

#19
20090120665
2009-05-14

Gold alloy wire for bonding wire having high bonding reliability, high roundness of compression ball, high straightness and high resin flowability resistance

#20
20090115059
2009-05-07

Gold wire for semiconductor element connection

#21
20090101695
2009-04-23

Gold alloy wire for bonding wire having high initial bondability, high bonding reliability, high roundness of compression ball, high straightness, and high resin flowability resistance

#22
20080251918
2008-10-16

Wire Bonds Having Pressure-Absorbing Balls

#23
20080105975
2008-05-08

Gold wire for connecting semiconductor chip

#24
20080075626
2008-03-27

Wire Bump Material

#25
20080061440
2008-03-13

Copper alloy bonding wire for semiconductor device

#26
20080050267
2008-02-28

Au Alloy Bonding Wire

#27
20070298276
2007-12-27

Au bonding wire for semiconductor device

#28
20060251538
2006-11-09

Au alloy bonding wire

#29
20060186544
2006-08-24

Copper bonding wire for semiconductor packaging

#30
20060144907
2006-07-06

Wire bonds having pressure-absorbing balls