221827 ⎘
Logic circuits, i.e. having at least two inputs acting on one output ; Inverting circuits; Modifications for increasing the reliability for protection; Radiation hardening In field effect transistor circuits
TRIPLE MODULE REDUNDANT SOLID STATE POWER SWITCH
#2RADIATION HARDENED LOW NOISE POWER MANAGEMENT DEVICE
#3SINGLE EVENT UPSET HARDENED FLIP-FLOP AND METHODS OF OPERATION
#4FLIP-FLOP WITH SELF CORRECTION
#5Semiconductor device
#6Circuit for mitigating single-event-transients
#7Fault resilient flip-flop with balanced topology and negative feedback
#8Triple modular redundancy flip-flop with improved power performance area and design for testability
#9Circuit arrangements and methods for forming the same
#10Circuit, method for sizing an aspect ratio of transistors of a circuit, and circuit arrangement
#11SEMICONDUCTOR INTEGRATED CIRCUIT WITH RADIATION RESISTANCE
#12Flip-flop with soft error tolerance
#13Circuit and method of forming the same
#14Soft error-resilient latch
#15Single event latchup recovery with state protection
#16Compensating for degradation of electronics due to radiation vulnerable components
#17Radiation-resistant asynchronous communications
#18Radiation-damage-compensation-circuit and SOI-MOSFET
#19Level shifter circuit, corresponding device and method
#20Digital register component and analog-digital converter detecting signal distortion in high-radiation environments
#21Dual interlocked logic circuits
#22High voltage tolerant CMOS driver for low-voltage bi-directional communication buses
#23Tristate and cross current free output buffer
#24HARDENED STORAGE ELEMENT
#25Data register for radiation hard applications
#26Semiconductor device
#27Radiation hardened by design digital input/output circuits and related methods
#28Communication apparatus with slew rate feedback
#29Integrated circuit having improved radiation immunity
#30Soft error and radiation hardened sequential logic cell
#31Single event transient and upset mitigation for silicon-on-insulator CMOS technology
#32Soft error resilient circuit design method and logic cells
#33Radiation-tolerant overcurrent detection
#34LAYOUT METHOD FOR SOFT-ERROR HARD ELECTRONICS, AND RADIATION HARDENED LOGIC CELL
#35Integrated circuit elementary cell with a low sensitivity to external disturbances
#36(N-1)-out-of-N voter mux with enhanced drive
#37Electronic circuit arrangement for processing binary input values
#38Layout method for soft-error hard electronics, and radiation hardened logic cell
#39Radiation hardened circuit design for multinode upsets
#40Semiconductor integrated circuit device
#41Logic circuit protected against transient disturbances
#42Soft error hard electronic circuit and layout
#43Fault tolerant asynchronous circuits
#44SEU tolerant arbiter
#45Low voltage, high speed data latch
#46Fault triggerred automatic redundancy scrubber
#47Semiconductor integrated circuit having latch circuit applied changeable capacitance and method thereof
#48Method and apparatus for an event tolerant storage circuit
#49Logic circuit protected against transient disturbances
#50ELECTRONIC DEVICE HAVING LOGIC CIRCUITRY AND METHOD FOR DESIGNING LOGIC CIRCUITRY
#51LAYOUT METHOD FOR SOFT-ERROR HARD ELECTRONICS, AND RADIATION HARDENED LOGIC CELL
#52SEU hardening circuit and method
#53Set dominant latch with soft error resiliency
#54Method for radiation tolerance by logic book folding
#55Fault tolerant asynchronous circuits
#56APPARATUS AND METHOD OF ERROR DETECTION AND CORRECTION IN A RADIATION-HARDENED STATIC RANDOM ACCESS MEMORY FIELD-PROGRAMMABLE GATE ARRAY
#57Integrated circuit
#58RADIATION TOLERANT ELECTROSTATIC DISCHARGE PROTECTION NETWORKS
#59SET HARDENED REGISTER
#60LOCAL CONTROLLER FOR RECONFIGURABLE PROCESSING ELEMENTS
#61Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
#62Semiconductor integrated circuit device
#63Fault tolerant asynchronous circuits
#64Logic circuit protected against transitory perturbations
#65Radiation hardened differential output buffer
#66Circuit for distributing an initial signal with a tree structure, protected against logic random events
#67Radiation hardened logic circuit
#68Semiconductor integrated circuit
#69Radiation tolerant combinational logic cell
#70Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
#71Dual redundant dynamic logic
#72Dual path redundancy with stacked transistor voting
#73Radiation tolerant electrostatic discharge protection networks
#74Single-event-effect tolerant SOI-based inverter, NAND element, NOR element, semiconductor memory device and data latch circuit
#75Logic cell with two isolated redundant outputs, and corresponding integrated circuit
#76Redundancy circuits hardened against single event upsets
#77Method and system for reducing glitch effects within combinational logic
#78Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
#79Pulse-rejecting circuit for suppressing single-event transients
#80Single event upset hardened circuitry without sensitivity to overshoot and/or undershoot conditions
#81Method and apparatus for providing SEU-tolerant circuits
#82Radiation-tolerant inrush limiter
#83Radiation tolerant DC/DC converter with non-radiation hardened parts
#84Single event upset immune keeper circuit and method for dual redundant dynamic logic
#85Data retaining circuit
#86Data retaining circuit
#87Data retaining circuit
#88Radiation hardening of logic circuitry using a cross enabled, interlocked logic system and method
#89Redundant single event upset supression system
#90Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array
#91Radiation hardened housekeeping slave node (RH-HKSN) application specific integrated circuit (ASIC) element
#92Complementary self-limiting logic
#93Radiation event protection circuit with double redundancy and latch
#94Circuit for and method of storing data in an integrated circuit device
#95Radiation-hardened CMOS logic device
#96Charge steering latch for low soft error rate
#97Radiation hardened structured ASIC platform with compensation of delay for temperature and voltage variations for multiple redundant temporal voting latch technology