ClassID:

221827

H03K19/00338 - CPC Classification

Classification description:

Logic circuits, i.e. having at least two inputs acting on one output ; Inverting circuits; Modifications for increasing the reliability for protection; Radiation hardening In field effect transistor circuits

Recent Application in this class:
#1
20260155823
2026-06-04

TRIPLE MODULE REDUNDANT SOLID STATE POWER SWITCH

#2
20250385674
2025-12-18

RADIATION HARDENED LOW NOISE POWER MANAGEMENT DEVICE

#3
20240372539
2024-11-07

SINGLE EVENT UPSET HARDENED FLIP-FLOP AND METHODS OF OPERATION

#4
20240356549
2024-10-24

FLIP-FLOP WITH SELF CORRECTION

#5
20230080416
2023-03-16

Semiconductor device

#6
20220368327
2022-11-17

Circuit for mitigating single-event-transients

#7
20220190813
2022-06-16

Fault resilient flip-flop with balanced topology and negative feedback

#8
20220109445
2022-04-07

Triple modular redundancy flip-flop with improved power performance area and design for testability

#9
20210083665
2021-03-18

Circuit arrangements and methods for forming the same

#10
20210058083
2021-02-25

Circuit, method for sizing an aspect ratio of transistors of a circuit, and circuit arrangement

#11
20210021266
2021-01-21

SEMICONDUCTOR INTEGRATED CIRCUIT WITH RADIATION RESISTANCE

#12
20200235736
2020-07-23

Flip-flop with soft error tolerance

#13
20200126971
2020-04-23

Circuit and method of forming the same

#14
20200007129
2020-01-02

Soft error-resilient latch

#15
20190278660
2019-09-12

Single event latchup recovery with state protection

#16
20190207606
2019-07-04

Compensating for degradation of electronics due to radiation vulnerable components

#17
20190181864
2019-06-13

Radiation-resistant asynchronous communications

#18
20190131965
2019-05-02

Radiation-damage-compensation-circuit and SOI-MOSFET

#19
20190068194
2019-02-28

Level shifter circuit, corresponding device and method

#20
20180367156
2018-12-20

Digital register component and analog-digital converter detecting signal distortion in high-radiation environments

#21
20180367143
2018-12-20

Dual interlocked logic circuits

#22
20180175859
2018-06-21

High voltage tolerant CMOS driver for low-voltage bi-directional communication buses

#23
20180138942
2018-05-17

Tristate and cross current free output buffer

#24
20180062652
2018-03-01

HARDENED STORAGE ELEMENT

#25
20160283142
2016-09-29

Data register for radiation hard applications

#26
20160049938
2016-02-18

Semiconductor device

#27
20150349775
2015-12-03

Radiation hardened by design digital input/output circuits and related methods

#28
20140375359
2014-12-25

Communication apparatus with slew rate feedback

#29
20140048887
2014-02-20

Integrated circuit having improved radiation immunity

#30
20140019921
2014-01-16

Soft error and radiation hardened sequential logic cell

#31
20140015564
2014-01-16

Single event transient and upset mitigation for silicon-on-insulator CMOS technology

#32
20130162293
2013-06-27

Soft error resilient circuit design method and logic cells

#33
20130099796
2013-04-25

Radiation-tolerant overcurrent detection

#34
20130038348
2013-02-14

LAYOUT METHOD FOR SOFT-ERROR HARD ELECTRONICS, AND RADIATION HARDENED LOGIC CELL

#35
20130009665
2013-01-10

Integrated circuit elementary cell with a low sensitivity to external disturbances

#36
20130009664
2013-01-10

(N-1)-out-of-N voter mux with enhanced drive

#37
20130002288
2013-01-03

Electronic circuit arrangement for processing binary input values

#38
20120185816
2012-07-19

Layout method for soft-error hard electronics, and radiation hardened logic cell

#39
20120182048
2012-07-19

Radiation hardened circuit design for multinode upsets

#40
20110175197
2011-07-21

Semiconductor integrated circuit device

#41
20110167324
2011-07-07

Logic circuit protected against transient disturbances

#42
20100264953
2010-10-21

Soft error hard electronic circuit and layout

#43
20100207658
2010-08-19

Fault tolerant asynchronous circuits

#44
20100176841
2010-07-15

SEU tolerant arbiter

#45
20100079183
2010-04-01

Low voltage, high speed data latch

#46
20100026338
2010-02-04

Fault triggerred automatic redundancy scrubber

#47
20100019839
2010-01-28

Semiconductor integrated circuit having latch circuit applied changeable capacitance and method thereof

#48
20090322401
2009-12-31

Method and apparatus for an event tolerant storage circuit

#49
20090259897
2009-10-15

Logic circuit protected against transient disturbances

#50
20090230988
2009-09-17

ELECTRONIC DEVICE HAVING LOGIC CIRCUITRY AND METHOD FOR DESIGNING LOGIC CIRCUITRY

#51
20090184733
2009-07-23

LAYOUT METHOD FOR SOFT-ERROR HARD ELECTRONICS, AND RADIATION HARDENED LOGIC CELL

#52
20090135643
2009-05-28

SEU hardening circuit and method

#53
20090085601
2009-04-02

Set dominant latch with soft error resiliency

#54
20090045840
2009-02-19

Method for radiation tolerance by logic book folding

#55
20090027078
2009-01-29

Fault tolerant asynchronous circuits

#56
20080297191
2008-12-04

APPARATUS AND METHOD OF ERROR DETECTION AND CORRECTION IN A RADIATION-HARDENED STATIC RANDOM ACCESS MEMORY FIELD-PROGRAMMABLE GATE ARRAY

#57
20080197875
2008-08-21

Integrated circuit

#58
20080158747
2008-07-03

RADIATION TOLERANT ELECTROSTATIC DISCHARGE PROTECTION NETWORKS

#59
20080115023
2008-05-15

SET HARDENED REGISTER

#60
20080022081
2008-01-24

LOCAL CONTROLLER FOR RECONFIGURABLE PROCESSING ELEMENTS

#61
20080007288
2008-01-10

Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array

#62
20070285118
2007-12-13

Semiconductor integrated circuit device

#63
20070262786
2007-11-15

Fault tolerant asynchronous circuits

#64
20070250748
2007-10-25

Logic circuit protected against transitory perturbations

#65
20070236246
2007-10-11

Radiation hardened differential output buffer

#66
20070216464
2007-09-20

Circuit for distributing an initial signal with a tree structure, protected against logic random events

#67
20070205799
2007-09-06

Radiation hardened logic circuit

#68
20070176233
2007-08-02

Semiconductor integrated circuit

#69
20070109865
2007-05-17

Radiation tolerant combinational logic cell

#70
20070103966
2007-05-10

Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array

#71
20070103194
2007-05-10

Dual redundant dynamic logic

#72
20070103185
2007-05-10

Dual path redundancy with stacked transistor voting

#73
20070075373
2007-04-05

Radiation tolerant electrostatic discharge protection networks

#74
20070069305
2007-03-29

Single-event-effect tolerant SOI-based inverter, NAND element, NOR element, semiconductor memory device and data latch circuit

#75
20070063728
2007-03-22

Logic cell with two isolated redundant outputs, and corresponding integrated circuit

#76
20070052442
2007-03-08

Redundancy circuits hardened against single event upsets

#77
20060164143
2006-07-27

Method and system for reducing glitch effects within combinational logic

#78
20060145722
2006-07-06

Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array

#79
20060119410
2006-06-08

Pulse-rejecting circuit for suppressing single-event transients

#80
20060119379
2006-06-08

Single event upset hardened circuitry without sensitivity to overshoot and/or undershoot conditions

#81
20060090099
2006-04-27

Method and apparatus for providing SEU-tolerant circuits

#82
20060082939
2006-04-20

Radiation-tolerant inrush limiter

#83
20060049864
2006-03-09

Radiation tolerant DC/DC converter with non-radiation hardened parts

#84
20060001442
2006-01-05

Single event upset immune keeper circuit and method for dual redundant dynamic logic

#85
20050248379
2005-11-10

Data retaining circuit

#86
20050242863
2005-11-03

Data retaining circuit

#87
20050231257
2005-10-20

Data retaining circuit

#88
20050156620
2005-07-21

Radiation hardening of logic circuitry using a cross enabled, interlocked logic system and method

#89
20050127971
2005-06-16

Redundant single event upset supression system

#90
20050040844
2005-02-24

Apparatus and method of error detection and correction in a radiation-hardened static random access memory field-programmable gate array

#91
17388555
2022-11-08

Radiation hardened housekeeping slave node (RH-HKSN) application specific integrated circuit (ASIC) element

#92
16428697
2020-08-04

Complementary self-limiting logic

#93
16271474
2020-07-14

Radiation event protection circuit with double redundancy and latch

#94
16107751
2019-04-16

Circuit for and method of storing data in an integrated circuit device

#95
15363041
2017-08-29

Radiation-hardened CMOS logic device

#96
15011224
2017-05-30

Charge steering latch for low soft error rate

#97
14862140
2018-03-06

Radiation hardened structured ASIC platform with compensation of delay for temperature and voltage variations for multiple redundant temporal voting latch technology