ClassID:

233434

H05H1/0081 - CPC Classification

Classification description:

Generating plasma; Handling plasma; Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature by electric means

Recent Application in this class:
#1
20260068025
2026-03-05

METHOD AND DEVICE FOR RECOGNIZING A PROCESS STATE OF A PLASMA ARC METHOD

#2
20260013029
2026-01-08

LOW-K RF ROD FOR RF BIAS POWER DELIVERY

#3
20230189423
2023-06-15

Method for measuring plasma ion nonextensive parameter

#4
20220356559
2022-11-10

Waveform shape factor for pulsed PVD power

#5
20220338337
2022-10-20

Langmuir probe operating at fixed voltages

#6
20220223389
2022-07-14

Device for detecting plasma of ultra fast with multi channel

#7
20220110206
2022-04-07

Method for measuring electron nonextensive parameter of plasma using nonextensive statistical mechanics

#8
20200051784
2020-02-13

Plasma generation apparatus, substrate treating apparatus including the same, and control method for the plasma generation apparatus

#9
20200033293
2020-01-30

Microscale gas breakdown device and process

#10
20190198373
2019-06-27

Method for controlling semiconductor process

#11
20190174616
2019-06-06

Method and system for carrying out plasma chemical reaction in gas flow

#12
20180067079
2018-03-08

Dielectric barrier discharge ionization detector

#13
20170290137
2017-10-05

Suppression of self pulsing DC driven nonthermal microplasma discharge to operate in a steady DC mode

#14
20160198558
2016-07-07

Apparatus and method for determining the type, density and temperature of neutral radicals in plasma

#15
20160155612
2016-06-02

Feedforward temperature control for plasma processing apparatus

#16
20150319834
2015-11-05

Method and control unit for operating a plasma generation apparatus

#17
20140312241
2014-10-23

Plasma evaluation apparatus

#18
20140062306
2014-03-06

System and method of determining effective glow discharge lamp current

#19
20140062303
2014-03-06

Systems and methods for calibrating a switched mode ion energy distribution system

#20
20130320998
2013-12-05

In-situ VHF current sensor for a plasma reactor

#21
20130221847
2013-08-29

Method and apparatus for detecting arc in plasma chamber

#22
20130160523
2013-06-27

Device and use of the device for measuring the density and/or the electron temperature and/or the collision frequency of a plasma

#23
20130124124
2013-05-16

Atomic flux measurement device

#24
20120248322
2012-10-04

Methods of electrical signaling in an ion energy analyzer

#25
20120248311
2012-10-04

Ion energy analyzer and methods of manufacturing the same

#26
20120248310
2012-10-04

Ion energy analyzer

#27
20120086464
2012-04-12

In-situ VHF voltage sensor for a plasma reactor

#28
20120084046
2012-04-05

LC resonance probe for determining local plasma density

#29
20120084026
2012-04-05

Method and system for characterizing a plasma

#30
20120019267
2012-01-26

High frequency detection device and coaxial cable including the same

#31
20110186545
2011-08-04

Feedforward temperature control for plasma processing apparatus

#32
20110061811
2011-03-17

PLASMA PROCESSING APPARATUS

#33
20100244861
2010-09-30

Plasma monitoring method

#34
20100229372
2010-09-16

Methods for measuring a set of electrical characteristics in a plasma

#35
20100209292
2010-08-19

Plasma sterilizing device and method

#36
20100006417
2010-01-14

Capacitively-coupled electrostatic (CCE) probe arrangement for detecting strike step in a plasma processing chamber and methods thereof

#37
20090218324
2009-09-03

Direct real-time monitoring and feedback control of RF plasma output for wafer processing

#38
20090151871
2009-06-18

Systems for detecting unconfined-plasma events

#39
20090140828
2009-06-04

Methods and apparatus for controlling characteristics of a plasma

#40
20090132189
2009-05-21

METHOD FOR DETERMINING PLASMA CHARACTERISTICS

#41
20090130856
2009-05-21

Method for monitoring process drift using plasma characteristics

#42
20080265903
2008-10-30

Plasma diagnostic apparatus and method

#43
20080066861
2008-03-20

Plasma processing chamber with an apparatus for measuring a set of electrical characteristics in a plasma

#44
20070294043
2007-12-20

Method for determining plasma characteristics

#45
20070289359
2007-12-20

Method for determining plasma characteristics

#46
20070252580
2007-11-01

Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor

#47
20070215814
2007-09-20

Particle beam current measurement system

#48
20070074812
2007-04-05

Temperature control of plasma density probe

#49
20070074811
2007-04-05

Method and apparatus for measuring plasma density in processing reactors using a long dielectric tube

#50
20070000843
2007-01-04

Apparatus for measuring a set of electrical characteristics in a plasma

#51
20060262889
2006-11-23

Synchronous undersampling for high-frequency voltage and current measurements

#52
20060214593
2006-09-28

Electron temperature measurement method, electron temperature measurement program for implementing the method, and storage medium storing the electron temperature measurement program

#53
20060043063
2006-03-02

Electrically floating diagnostic plasma probe with ion property sensors

#54
20050083065
2005-04-21

Plasma potential measuring method and apparatus, and plasma potential measuring probe

#55
16436230
2021-10-19

Plasma-based electro-optical sensing and methods