ClassID:

238666

Y10S148/012 - CPC Classification

Classification description:

Metal treatment Bonding, e.g. electrostatic for strain gauges

Recent Application in this class:
#1
20170170132
2017-06-15

Three dimensional device integration method and integrated device

#2
20160322328
2016-11-03

Method for low temperature bonding and bonded structure

#3
20160190093
2016-06-30

Three dimensional device integration method and integrated device

#4
20160086913
2016-03-24

Method for low temperature bonding and bonded structure

#5
20150303263
2015-10-22

Method for low temperature bonding and bonded structure

#6
20150287692
2015-10-08

Three dimensional device integration method and integrated device

#7
20140206176
2014-07-24

Method for low temperature bonding and bonded structure

#8
20120097638
2012-04-26

Method For Low Temperature Bonding And Bonded Structure

#9
20110067803
2011-03-24

Method for low temperature bonding and bonded structure

#10
20100163169
2010-07-01

Method for low temperature bonding and bonded structure

#11
20090263953
2009-10-22

Method for low temperature bonding and bonded structure

#12
20080093747
2008-04-24

Three dimensional device integration method and integrated device

#13
20080063878
2008-03-13

Method for low temperature bonding and bonded structure

#14
20080061419
2008-03-13

Three dimensional device integration method and integrated device

#15
20080061418
2008-03-13

Three dimensional device integration method and integrated device

#16
20080053959
2008-03-06

Method for low temperature bonding and bonded structure

#17
20060292744
2006-12-28

Three dimensional device integration method and integrated device

#18
20060141742
2006-06-29

Method of producing a complex structure by assembling stressed structures

#19
20060110843
2006-05-25

Method of manufacturing external force detection sensor

#20
20060073640
2006-04-06

Diamond substrate formation for electronic assemblies

#21
20050079712
2005-04-14

Method for low temperature bonding and bonded structure