240272 ⎘
Active solid-state devices, e.g. transistors, solid-state diodes Plural dram cells share common contact or common trench
Structure for high density stable static random access memory
#2Multiple layer barrier metal for device component formed in contact trench
#3Power device with self-aligned source regions
#4Multi-resistive integrated circuit memory
#5Methods of fabricating flash memory devices having shared sub active regions
#6Multiple layer barrier metal for device component formed in contact trench
#7Trench-gated MIS devices
#8Power device with trenches having wider upper portion than lower portion
#9Methods of fabricating flash memory devices having shared sub active regions
#10Multi-resistive integrated circuit memory
#11Power device with trenches having wider upper portion than lower portion
#12Container capacitor structure and method of formation thereof
#13High density stable static random access memory
#14Cell structure of semiconductor device having an active region with a concave portion
#15Highly integrated and reliable DRAM and its manufacture
#16MANUFACTURING METHOD OF NONVOLATILE MEMORY
#17Semiconductor integrated circuit devices having contacts formed of single-crystal materials
#18Checkerboard deep trench dynamic random access memory cell array layout
#19Semiconductor integrated circuit device and method of producing the same
#20Method of fabricating memory including diode
#21Semiconductor memory device
#22Semiconductor device
#23Power device with trenches having wider upper portion than lower portion
#24Transistor array for semiconductor memory devices and method for fabricating a vertical channel transistor array
#25Semiconductor device having contact barrier and method of manufacturing the same
#26Semiconductor device
#27Semiconductor device
#28Semiconductor device
#29Method for fabricating metallic bit-line contacts
#30High density memory array having increased channel widths
#31Memory cell array with specific placement of field stoppers
#32Highly integrated and reliable DRAM and its manufacture
#33Device for subtracting or adding charge in a charge-coupled device
#34Method of manufacturing a semiconductor device
#35Flash memory devices having shared sub active regions
#36Methods of forming and using memory cell structures
#37Container capacitor structure and method of formation thereof
#38Method of fabricating cell of nonvolatile memory device with floating gate
#39Highly integrated and reliable DRAM and its manufacture
#40Methods of forming memory circuitry
#41Semiconductor device including a plurality of wiring lines
#42Multi-resistive integrated circuit memory
#43Apparatus and method for reducing gate leakage in deep sub-micron MOS transistors using semi-rectifying contacts
#44Capacitor that includes high permittivity capacitor dielectric
#45Thermal conducting trench in a semiconductor structure
#46Transistor array for semiconductor memory devices and method for fabricating a vertical channel transistor array
#47High density memory devices having improved channel widths and cell size
#48Semiconductor substrate having first and second pairs of word lines
#49Integrated circuit device having non-linear active area pillars
#50High density memory array having increased channel widths
#51Trench capacitor dynamic random access memory featuring structurally independent symmetric active areas
#52Nonvolatile memory
#53High density access transistor having increased channel width and methods of fabricating such devices
#54Device for subtracting or adding charge in a charge-coupled device
#55Hemispherical silicon grain capacitor with variable grain size
#56Container capacitor structure and method of formation thereof
#57Semiconductor device
#58Memory device
#59Test key for monitoring gate conductor to deep trench misalignment
#60Semiconductor device having both memory and logic circuit and its manufacture
#61Method of manufacturing an integrated circuit including capacitor with high permittivity capacitor dielectric
#62Method for stabilizing or offsetting voltage in an integrated circuit
#63Semiconductor device and method of manufacturing the same
#64Semiconductor device
#65Methods of forming memory circuitry
#66Memory having reduced memory cell size
#67Semiconductor device and method of manufacturing the same
#68Method for forming a trench MOSFET having self-aligned features
#69High-density NROM-FINFET
#70Power MOSFET and method for forming same using a self-aligned body implant
#71Image device and photodiode structure
#72Vertical DRAM and fabrication method thereof
#73Semiconductor integrated circuit device and method of producing the same
#74Selective polysilicon stud growth
#75Semiconductor memory device
#76Test structure for a single-sided buried strap DRAM memory cell array
#77Arrays of nonvolatile memory cells wherein each cell has two conductive floating gates
#78Capacitor that includes high permittivity capacitor dielectric
#79Methods of forming memory circuitry