240280 ⎘
Active solid-state devices, e.g. transistors, solid-state diodes with means to absorb or localize unwanted impurities or defects from semiconductors, e.g. heavy metal gettering
Removal of impurities from semiconductor device layers
#2Semiconductor device and method for fabricating same
#3Wafer-level packaging of micro devices
#4SILICON ON INSULATOR STRUCTURE WITH A SINGLE CRYSTAL CZ SILICON DEVICE LAYER HAVING A REGION WHICH IS FREE OF AGGLOMERATED INTRINSIC POINT DEFECTS
#5Non-uniform minority carrier lifetime distributions in high performance silicon power devices
#6Gettering using voids formed by surface transformation
#7Gettering using voids formed by surface transformation
#8Semiconductor device and method for manufacturing the same
#9Method of manufacturing semiconductor device and semiconductor device
#10Gettering using voids formed by surface transformation
#11Solid-state image device
#12Process for implementing oxygen into a silicon wafer having a region which is free of agglomerated intrinsic point defects
#13Semiconductor metal contamination reduction for ultra-thin gate dielectrics
#14Epitaxial silicon wafer with intrinsic gettering and a method for the preparation thereof
#15Protected organic electronic device structures incorporating pressure sensitive adhesive and desiccant
#16Semiconductor device
#17Gettering using voids formed by surface transformation
#18Gettering using voids formed by surface transformation
#19Process for making non-uniform minority carrier lifetime distribution in high performance silicon power devices