243639 ⎘
Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe; Scanning probe control process Particular movement or positioning of scanning tip
Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
#2Apparatus for Direct Fabrication of Nanostructures
#3Scanning probe-based lithography method
#4Scanning probe microscope capable of measuring samples having overhang structure
#5Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
#6Scanning probe microscope apparatus
#7THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY
#8Scanning probe apparatus
#9Scanning probe microscope
#10Scanning probe-based lithography method
#11Scanning probe microscope capable of measuring samples having overhang structure
#12Scanning probe microscope system
#13Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
#14Scanning probe apparatus
#15Scanning probe in pulsed-force mode, digital and in real time
#16Scanning probe microscopy method and apparatus utilizing sample pitch
#17Nanometer scale data storage device and associated positioning system
#18System for sensing a sample
#19System for Sensing a Sample
#20Scanning probe microscope and scanning method
#21Apparatus for and method of bonding nano-tip using electrochemical etching
#22Scanning probe-based lithography method
#23Method of approaching probe and apparatus for realizing the same
#24Thermal control of deposition in dip pen nanolithography
#25Precision machining method using a near-field scanning optical microscope
#26System for sensing a sample
#27Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope
#28Nanometer scale data storage device and associated positioning system
#29Active probe for an atomic force microscope and method for use thereof
#30Sensing mode atomic force microscope
#31Scanning tip orientation adjustment method for atomic force microscopy