ClassID:

243637

Y10S977/849 - CPC Classification

Classification description:

Nanotechnology; Manufacture, treatment, or detection of nanostructure with scanning probe

Sub-classes:
Recent Application in this class:
#1
20140082776
2014-03-20

Fluid delivery for scanning probe microscopy

#2
20120225251
2012-09-06

ETCHING AND HOLE ARRAYS

#3
20120066800
2012-03-15

FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY

#4
20110297084
2011-12-08

Apparatus for Direct Fabrication of Nanostructures

#5
20110086781
2011-04-14

Method for forming composites of sub-arrays of fullerene nanotubes

#6
20110020533
2011-01-27

Scanning probe-based lithography method

#7
20100330345
2010-12-30

Methods utilizing scanning probe microscope tips and products thereof or produced thereby

#8
20100132076
2010-05-27

Fluid delivery for scanning probe microscopy

#9
20100047621
2010-02-25

Aligned nanostructures on a tip

#10
20090326866
2009-12-31

Methods and apparatus for statistical characterization of nano-particles

#11
20090255465
2009-10-15

THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY

#12
20090230320
2009-09-17

Scanning probe apparatus

#13
20090172846
2009-07-02

Nanometric emitter/receiver guides

#14
20090169463
2009-07-02

Array of fullerene nanotubes

#15
20090155587
2009-06-18

Multicomponent Nanorods

#16
20090100553
2009-04-16

Scanning probe-based lithography method

#17
20090004094
2009-01-01

Method for cutting fullerene nanotubes

#18
20080311025
2008-12-18

Method for forming a patterned array of fullerene nanotubes

#19
20080260941
2008-10-23

Method for fabricating a long-range ordered periodic array of nano-features, and articles comprising same

#20
20080224100
2008-09-18

Methods for producing composites of fullerene nanotubes and compositions thereof

#21
20080182079
2008-07-31

Etching and hole arrays

#22
20080107586
2008-05-08

Method for producing a catalyst support and compositions thereof

#23
20080089830
2008-04-17

Fullerene nanotube compositions

#24
20080073554
2008-03-27

Spin-polarized electron source and spin-polarized scanning tunneling microscope

#25
20080072593
2008-03-27

Wireless technique for microactivation

#26
20080063588
2008-03-13

Method for purification of as-produced fullerene nanotubes

#27
20080054168
2008-03-06

Near-field scanning optical microscope probe having a light emitting diode

#28
20080020301
2008-01-24

Method and device for fabricating nano-structure with patterned particle beam

#29
20080020141
2008-01-24

Method of applying membrane lipids to a substrate

#30
20080017809
2008-01-24

Scanning probe microscope system

#31
20080000293
2008-01-03

SPM cantilever and manufacturing method thereof

#32
20070240516
2007-10-18

Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly

#33
20070220958
2007-09-27

Optical detection alignment/tracking method and apparatus

#34
20070158559
2007-07-12

Scanning probe apparatus

#35
20070089528
2007-04-26

Strain detection for automated nano-manipulation

#36
20070077429
2007-04-05

Multicomponent nanorods

#37
20070075243
2007-04-05

Scanning probe microscopy method and apparatus utilizing sample pitch

#38
20070048209
2007-03-01

Continuous fiber of fullerene nanotubes

#39
20070043158
2007-02-22

Method for producing self-assembled objects comprising fullerene nanotubes and compositions thereof

#40
20060231754
2006-10-19

Telegraph signal microscopy device and method

#41
20060230475
2006-10-12

Method of fabricating a probe having a field effect transistor channel structure

#42
20060225164
2006-10-05

Scanning probe characterization of surfaces

#43
20060150721
2006-07-13

Fluid delivery for scanning probe microscopy

#44
20060113472
2006-06-01

Scanning probe microscope and scanning method

#45
20060097164
2006-05-11

Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology

#46
20060091322
2006-05-04

Scanning probe-based lithography method

#47
20060076790
2006-04-13

Electrostatically driven carbon nanotube gripping device

#48
20060043276
2006-03-02

Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe

#49
20060040057
2006-02-23

Thermal control of deposition in dip pen nanolithography

#50
20050260120
2005-11-24

Method for forming an array of single-wall carbon nanotubes in an electric field and compositions thereof

#51
20050249656
2005-11-10

Method for forming a patterned array of single-wall carbon nanotubes

#52
20050181132
2005-08-18

Methods utilizing scanning probe microscope tips and products therefor or produced thereby

#53
20050172704
2005-08-11

Methods utilizing scanning probe microscope tips and products thereof or produced thereby

#54
20050139767
2005-06-30

Multiple directional scans of test structures on semiconductor integrated circuits

#55
20050104062
2005-05-19

Sub-nanoscale electronic devices and processes

#56
20050077468
2005-04-14

Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces

#57
20050066714
2005-03-31

Active probe for an atomic force microscope and method for use thereof

#58
20050005688
2005-01-13

Dual stage instrument for scanning a specimen