GANEI YEHUDA
Israel
15
2018-02-01
The entities that hold a legal rights for patent applications filed by inventor SCHEINER DAVID:
DAVID SCHEINER from GANEI YEHUDA, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
#2 | 2016-11-10Lateral shift measurement using an optical technique
#3 | 2014-12-25Optical system and method for measurement of one or more parameters of via-holes
#4 | 2010-11-11Optical system and method for measurement of one or more parameters of via-holes
#5 | 2010-08-26Lateral shift measurement using an optical technique
#6 | 2009-08-27REFLECTIVE OPTICAL SYSTEM
#7 | 2008-03-27Lateral shift measurement using an optical technique
#8 | 2007-11-22Reflective optical system
#9 | 2007-02-15Lateral shift measurement using an optical technique
#10 | 2006-05-18Lateral shift measurement using an optical technique
#11 | 2005-12-22Reflective optical system
#12 | 2005-09-06Method and system for measuring the topography of a sample
#13 | 2005-07-07Method and apparatus for measurements of patterned structures
#14 | 2005-04-26Method and system for monitoring a process of material removal from the surface of a patterned structure
#15 | 2005-03-24Method and apparatus for measurements of patterned structures
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