Berlin
Germany
11
2017-04-27
The entities that hold a legal rights for patent applications filed by inventor Srocka Bernd:
Bernd Srocka from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Method and assembly for determining the thickness of a layer in a sample stack
#2 | 2017-02-02Method and assembly for determining the thickness of a layer in a sample stack
#3 | 2015-11-05Inspection apparatus
#4 | 2015-10-08Inspection assembly
#5 | 2015-05-07Inspection arrangement
#6 | 2015-02-19Measurement method for height profiles of surfaces using a differential interference contrast image
#7 | 2015-02-05Inspection Method
#8 | 2015-01-15Method for detecting buried layers
#9 | 2012-05-10Inspection method with color correction
#10 | 2012-05-10Inspection system
#11 | 2006-08-31Method and device for determining a characteristic of a semiconductor sample
1033446 ⎘