🔗 Permalink

Inventor profile of:

Andreas Birkner

City:

Jena

Country:

Germany

Published Applications:

Last publication date:

2024-10-24

Top Assignees for applications by Andreas Birkner

The entities that hold a legal rights for patent applications filed by inventor Birkner Andreas:

INTEGRATED DYNAMICS ENGINEERING GMBH 4 Raunheim, Germany
Leica Microsystems Jena GmbH 3 Jena, Germany
VISTEC SEMICONDUCTOR SYSTEMS GMBH 1 Weilburg, Germany

Recent patent applications by Birkner Andreas

Andreas Birkner from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-10-24

US20240357784A1

Electricity

METHOD FOR PROCESSING SUBSTRATES, IN PARTICULAR WAFERS, MASKS OR FLAT PANEL DISPLAYS, WITH A SEMI-CONDUCTOR INDUSTRY MACHINE

#2 | 2023-12-07

US20230395417A1

Electricity

DEVICE AND METHOD FOR IMAGING AN OBJECT IN AT LEAST TWO VIEWS

#3 | 2021-11-11

US20210352835A1

Electricity

Method for processing substrates, in particular wafers, masks or flat panel displays, with a semi-conductor industry machine

#4 | 2018-06-07

US20180155126A1

Performing operations; transporting

SERVICE CART

#5 | 2017-09-21

US20170267504A1

Performing operations; transporting

Maintenance apparatus

#6 | 2013-08-15

US20130205822A1

Mechanical engineering

SYSTEM AND METHOD FOR COOLING A COMPUTER SYSTEM

#7 | 2013-02-28

US20130050931A1

Electricity

SYSTEM AND METHOD FOR COOLING A PROCESSING SYSTEM

#8 | 2008-09-25

US20080232672A1

Physics

Device and method for evaluating defects in the edge area of a wafer and use of the device in inspection system for wafers

#9 | 2006-04-18

US10768688

Method and arrangement for transporting and inspecting semiconductor substrates

#10 | 2005-11-08

US9880100

Substrate conveying module and system made up of substrate conveying module and workstation

#11 | 2005-01-18

US10050114

Arrangement and method for the identification of substrates

InventorID:

111350 ⎘