Eric G. Stevens

Methods and apparatus for a CCD image sensor

Method of forming a shallow pinned photodiode

Method of forming a shallow pinned photodiode

Image sensor with doped transfer gate

METHOD FOR FORMING PHOTODETECTOR ISOLATION IN IMAGERS

Photodetector isolation in image sensors

PHOTODETECTOR ISOLATION IN IMAGE SENSORS

Photodetector isolation in image sensors

Method for forming deep isolation in imagers

Image sensor with doped transfer gate

Back-illuminated image sensors having both frontside and backside photodetectors

Back-illuminated image sensors having both frontside and backside photodetectors

PMOS PIXEL STRUCTURE WITH LOW CROSS TALK FOR ACTIVE PIXEL IMAGE SENSORS

TRENCH ISOLATION REGIONS IN IMAGE SENSORS

Method of forming lateral overflow drain and channel stop regions in image sensors

Lateral overflow drain and channel stop regions in image sensors

SHALLOW TRENCH ISOLATION REGIONS IN IMAGE SENSORS

Back-illuminated CMOS image sensors

PIXEL STRUCTURE WITH A PHOTODETECTOR HAVING AN EXTENDED DEPLETION DEPTH

Two epitaxial layers to reduce crosstalk in an image sensor

TWO EPITAXIAL LAYERS TO REDUCE CROSSTALK IN AN IMAGE SENSOR

Method of thin lightshield process for solid-state image sensors

METHOD FOR ADDING AN IMPLANT AT THE SHALLOW TRENCH ISOLATION CORNER IN A SEMICONDUCTOR SUBSTRATE

PMOS pixel structure with low cross talk for active pixel image sensors

Photodetector and n-layer structure for improved collection efficiency

Photodetector structure for improved collection efficiency

Fast flush structure for solid-state image sensors

Methods to eliminate amplifier glowing artifact in digital images captured by an image sensor

Thin lightshield process for solid-state image sensors

Light shield process for solid-state image sensors

Thin lightshield process for solid-state image sensors

Method for forming light shield process for solid-state image sensor with multi-metallization layer