David HEAPS

City:

Yardley, Pennsylvania

Country:

United States

Published Applications:

Last publication date:

2015-11-12

Top Assignees for applications by David HEAPS

The entities that hold a legal rights for patent applications filed by inventor HEAPS David:

David HEAPS from Yardley, US has applied for patents for these inventions. The list has both pending applications and granted patents:

DYNAMIC MEASUREMENT OF MATERIAL PROPERTIES USING TERAHERTZ RADIATION WITH REAL-TIME THICKNESS MEASUREMENT FOR PROCESS CONTROL

Dynamic measurement of density using terahertz radiation with real-time thickness measurement for process control

InventorID:

1354473 ⎘