Advantest Corporation
Tokyo
Japan
1,622
2026-03-19
1,378
2026-05-12
Advantest Corporation is a Japanese company based in Tokyo, Japan. It is a leading manufacturer of automatic test equipment used in the semiconductor industry. The company was founded in 1954 and has since grown to become a global leader in the design, manufacture, and sale of semiconductor test systems. Advantest Corporation also provides services such as system integration, maintenance, and support. It has offices in the United States, Europe, and Asia.
Top Inventors for applications by Advantest Corporation
These are the the leading inventors for applications assigned to Advantest Corporation:
- Masahiro Ishida 70 Tokyo, Japan
- Toshiyuki Okayasu 60 Tokyo, Japan
- Takahiro Yamaguchi 56 Tokyo, Japan
- Yasuo Furukawa 36 Tokyo, Japan
- Shoji KOJIMA 33 Tokyo, Japan
- Daisuke Watanabe 32 Tokyo, Japan
- Kiyotaka Ichiyama 30 Tokyo, Japan
- Toshiyuki OKAYASU 28 Saitama, Japan
- Masakatsu Suda 25 Tokyo, Japan
- Mani SOMA 23 Seattle, WA United States
- Takashi Sekino 22 Tokyo, Japan
- Shinya Sato 19 Tokyo, Japan
- Daisuke Watanabe 19 Saitama, Japan
- Akiyoshi IRISAWA 19 Miyagi, Japan
- Yuki Endo 18 Tokyo, Japan
- Shin MASUDA 18 Miyagi, Japan
- Koji ASAMI 18 Tokyo, Japan
- Srdjan MALISIC 18 San Jose, CA United States
- Aritomo KIKUCHI 16 Tokyo, Japan
- Masaru DOI 15 Tokyo, Japan
- Chi YUAN 15 San Jose, CA United States
- TOSHIAKI AWAJI 14 TOKYO, Japan
- Jochen Rivoir 14 Magstadt, Germany
- Kazuhiro Yamamoto 13 Tokyo, Japan
- Advantest Corporation 13 Tokyo, Japan
- Ben ROGEL-FAVILA 13 San Jose, CA United States
- Shigeru Matsumura 13 Tokyo, Japan
- YASUHIDE KURAMOCHI 12 TOKYO, Japan
- Toshiyuki KIYOKAWA 12 Tokyo, Japan
- Hironori Tanaka 12 Tokyo, Japan
- Takao SAKURAI 12 Miyagi, Japan
- Koji ASAMI 12 Saitama, Japan
- Satoshi Kodera 12 Tokyo, Japan
- Akihiko Ito 12 Tokyo, Japan
- Mei-Mei SU 12 Mountain View, CA United States
- Tsuyoshi YAMASHITA 11 Tokyo, Japan
- Shin Sakiyama 11 Tokyo, Japan
- Kiyoto NAKAMURA 11 Miyagi, Japan
- Duane CHAMPOUX 11 San Jose, CA United States
- Shigeki NISHINA 11 Miyagi, Japan
- Yasuhide KURAMOCHI 11 Gunma, Japan
- HARRY HOU 11 SANTA CLARA, CA United States
- Tomoyu YAMASHITA 11 Miyagi, Japan
- Masaru GOISHI 10 Saitama, Japan
- Takayuki Nakamura 10 Tokyo, Japan
- Yoshikazu NAKAYAMA 10 Saitama, Japan
- Hiroyuki Hama 10 Tokyo, Japan
- Eiji KATO 10 Miyagi, Japan
- Yoshinari Kogure 9 Saitama, Japan
- Yoshihiro HASHIMOTO 9 Tokyo, Japan
- Yoshio KOMOTO 9 Gunma, Japan
- Noboru SAITO 9 Tokyo, Japan
- Hiroyasu NAKAYAMA 9 Saitama, Japan
- Tatsuya Yamada 9 Tokyo, Japan
- HIROKATSU NIIJIMA 9 TOKYO, Japan
- Motoki IMAMURA 9 Miyagi, Japan
- Masaru TSUTO 9 Saitama, Japan
- Taiichiro IDA 8 Gunma, Japan
- Giovanni Bianchi 8 Ehningen, Germany
- Yuya YAMADA 8 Tokyo, Japan
- Yoshikazu ABE 8 Miyagi, Japan
- Hisao HORI 8 Miyagi, Japan
- Hiroaki TAKEUCHI 8 Tokyo, Japan
- Hajime SUGIMURA 8 Saitama, Japan
- Hideo HARA 8 Miyagi, Japan
- Masakatsu SUDA 8 Saitama, Japan
- Kazunori SHIOTA 8 Miyagi, Japan
- Jose MOREIRA 8 Stuttgart, Germany
- Daniel LAM 8 San Jose, CA United States
- Masayuki Kawabata 8 Tokyo, Japan
- Atsunori Shibuya 8 Tokyo, Japan
- Hiroto Nakamura 8 Tokyo, Japan
- Shinichi ISHIKAWA 8 Saitama, Japan
- Roger McAleenan 8 San Jose, CA United States
- Kazumoto TAMURA 8 Gunma, Japan
- Mei-Mei SU 8 San Jose, CA United States
- Linden HSU 7 San Jose, CA United States
- Toru Ibane 7 Tokyo, Japan
- Hiroyuki Mineo 7 Tokyo, Japan
- Roland WOLFF 7 Santa Rosa, CA United States
- Masayoshi Ichikawa 7 Tokyo, Japan
- Tadao SAITO 7 Tokyo, Japan
- Masayuki KAWABATA 7 Saitama, Japan
- Masato Haruta 7 Saitama, Japan
- Yuji OGATA 7 Miyagi, Japan
- Takeshi YAGUCHI 7 Saitama, Japan
- Tomonori YANAGIDA 7 Miyagi, Japan
- Takashi FUJISAKI 7 Gunma, Japan
- Takahiko Shimizu 7 Tokyo, Japan
- Nobuei WASHIZU 7 Tokyo, Japan
- Seiji Amanuma 7 Tokyo, Japan
- Mitsunori AIZAWA 7 Saitama, Japan
- Satoshi Sudou 7 Tokyo, Japan
- Michael JONES 7 San Carlos, CA United States
- Yoshihiro SATO 7 Miyagi, Japan
- Hiroki Kimura 7 Tokyo, Japan
- Yasuo FURUKAWA 7 Saitama, Japan
- Yoshihiro HASHIMOTO 7 SAITAMA, Japan
- Natsuki Shiota 7 Tokyo, Japan
- Tasuku Fujibe 7 Tokyo, Japan
Recent patent applications by Advantest Corporation
Advantest Corporation based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
US20260079362A1
PhysicsOPTICAL COMB LIGHT SOURCE AND MEASURING APPARATUS
#2 | 2026-02-26US20260056563A1
PhysicsTEMPERATURE ADJUSTING SYSTEM, CONTROLLER, DEVICE HANDLING APPARATUS, TESTER, AND DEVICE TESTING APPARATUS
#3 | 2026-02-19US20260049962A1
PhysicsCONDITION DETERMINING APPARATUS, METHOD, AND RECORDING MEDIUM
#4 | 2026-01-22US20260024693A1
ElectricityLAYERED STRUCTURE AND INDUCTOR
#5 | 2026-01-22US20260023109A1
PhysicsBRIDGE BEAM, SEMICONDUCTOR DEVICE HANDLING APPARATUS, AND SEMICONDUCTOR DEVICE TESTING APPARATUS
#6 | 2026-01-01US20260003133A1
PhysicsOPTICAL CONNECTOR CONNECTION DETERMINING APPARATUS
#7 | 2025-11-13US20250347726A1
PhysicsELECTROMAGNETIC WAVE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM
#8 | 2025-10-16US20250322982A1
ElectricityCOAXIAL CABLE AND DEVICE TESTING APPARATUS
#9 | 2025-08-21US20250266799A1
ElectricityBIASING CIRCUIT
#10 | 2025-07-03US20250216443A1
PhysicsSEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS
#11 | 2025-07-03US20250216442A1
PhysicsSOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS
#12 | 2025-06-05US20250180602A1
PhysicsCONTACT TERMINAL, TERMINAL ASSEMBLY, AND DEVICE TESTING APPARATUS
#13 | 2025-05-29US20250172610A1
PhysicsDEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS
#14 | 2025-05-22US20250164705A1
PhysicsOPTICAL CONNECTOR
#15 | 2025-05-22US20250164549A1
PhysicsCOOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS
#16 | 2025-03-27US20250102599A1
PhysicsSIGNAL SOURCE SPECIFYING APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM
#17 | 2025-03-13US20250085335A1
PhysicsTESTING APPARATUS
#18 | 2025-03-06US20250079046A1
ElectricityCOAXIAL CABLE AND SEMICONDUCTOR DEVICE TESTING APPARATUS
#19 | 2025-03-06US20250076374A1
PhysicsSEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS
#20 | 2025-03-06US20250076367A1
PhysicsSEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM
#21 | 2025-03-06US20250076366A1
PhysicsSEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM
#22 | 2025-03-06 ✅ Patent 12,625,071 granted on 2026-05-12US20250076191A1
PhysicsELECTROMAGNETIC WAVE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM
#23 | 2025-02-06US20250044377A1
PhysicsIMAGE OUTPUT APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM
#24 | 2025-01-23US20250027988A1
PhysicsTEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS
#25 | 2025-01-23 ✅ Patent 12,560,640 granted on 2026-02-24US20250027982A1
PhysicsMETHOD, APPARATUS, AND NON-TRANSITORY COMPUTER MEDIUM FOR DETECTING DEFECTS OF A DEVICE UNDER TEST USING TIME-DOMAIN REFLECTOMETRY
#26 | 2024-12-05US20240402240A1
PhysicsTEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLING APPARATUS, TESTER, AND ELECTRONIC DEVICE TESTING APPARATUS
#27 | 2024-10-31 ✅ Patent 12,474,376 granted on 2025-11-18US20240361357A1
PhysicsAPPARATUS AND METHOD FOR CONDENSATION PREVENTION FOR 2-PHASE COOLING OF TEST ARRAY
#28 | 2024-09-19US20240310458A1
PhysicsMAGNETIC SIGNAL NOISE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM
#29 | 2024-09-12 ✅ Patent 12,535,503 granted on 2026-01-27US20240302411A1
PhysicsSEMICONDUCTOR WAFER TESTING APPARATUS, SEMICONDUCTOR WAFER TESTING SYSTEM, FLATNESS MEASURING DEVICE, AND METHOD OF ADJUSTING FLATNESS OF WIRING BOARD
#30 | 2024-09-05US20240295538A1
PhysicsRAW MILK MEASURING APPARATUS AND METHOD OF MANUFACTURING THE SAME
#31 | 2024-08-01 ✅ Patent 12,455,235 granted on 2025-10-28US20240255423A1
PhysicsOPTICAL COMB MEASURING APPARATUS
#32 | 2024-07-04 ✅ Patent 12,483,021 granted on 2025-11-25US20240223179A1
ElectricityPROTECTIVE CIRCUIT AND SWITCH CONTROL DEVICE
#33 | 2024-06-20 ✅ Patent 12,436,186 granted on 2025-10-07US20240201251A1
PhysicsSELF-RESET TESTING SYSTEMS AND METHODS
#34 | 2024-05-30 ✅ Patent 12,332,829 granted on 2025-06-17US20240176757A1
PhysicsAUTOMATIC TEST EQUIPMENT ARCHITECTURE PROVIDING ODD SECTOR SIZE SUPPORT
#35 | 2024-05-30 ✅ Patent 12,248,390 granted on 2025-03-11US20240176721A1
PhysicsLockless log and error reporting for automatic test equipment
#36 | 2024-05-30 ✅ Patent 12,222,844 granted on 2025-02-11US20240175916A1
PhysicsSystems and methods for testing virtual functions of a device under test
#37 | 2024-04-11 ✅ Patent 12,638,501 granted on 2026-05-26US20240118340A1
PhysicsPROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS
#38 | 2024-04-04 ✅ Patent 12,523,719 granted on 2026-01-13US20240111003A1
PhysicsMAGNETIC FIELD MEASURING APPARATUS
#39 | 2024-04-04 ✅ Patent 12,625,176 granted on 2026-05-12US20240110969A1
PhysicsTESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
#40 | 2024-03-28 ✅ Patent 12,437,244 granted on 2025-10-07US20240104443A1
PhysicsSYSTEM AND METHOD FOR RESERVING CLOUD-BASED INSTRUMENT
#41 | 2024-03-28 ✅ Patent 12,449,444 granted on 2025-10-21US20240103037A1
PhysicsTEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
#42 | 2024-03-21 ✅ Patent 12,293,802 granted on 2025-05-06US20240096432A1
PhysicsMemory queue operations to increase throughput in an ATE system
#43 | 2024-03-21 ✅ Patent 12,436,855 granted on 2025-10-07US20240095138A1
PhysicsSYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL PROTOCOL ENABLED DEVICES
#44 | 2024-03-21 ✅ Patent 12,353,306 granted on 2025-07-08US20240095137A1
PhysicsMANAGEMENT OF HOT ADD IN A TESTING ENVIRONMENT FOR DUTs THAT ARE CXL PROTOCOL ENABLED
#45 | 2024-03-21 ✅ Patent 12,197,303 granted on 2025-01-14US20240095136A1
PhysicsSystems and methods for testing cxl enabled devices in parallel
#46 | 2024-03-21 ✅ Patent 12,360,868 granted on 2025-07-15US20240095135A1
PhysicsCXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS
#47 | 2024-03-21 ✅ Patent 12,253,578 granted on 2025-03-18US20240094311A1
PhysicsSignal vector derivation apparatus, method, program, and recording medium
#48 | 2024-03-21 ✅ Patent 12,216,163 granted on 2025-02-04US20240094293A1
PhysicsSystems and methods of testing devices using CXL for increased parallelism
#49 | 2024-02-22 ✅ Patent 12,287,366 granted on 2025-04-29US20240061034A1
PhysicsAutomated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback
#50 | 2024-02-22 ✅ Patent 12,596,143 granted on 2026-04-07US20240061030A1
PhysicsOVER THE AIR (OTA) TESTING OF AN ANTENNA IN PACKAGE (AIP) DEVICE IN RADIATING NEAR FIELD USING A CHARACTERIZING DEVICE AND AUTOMATED TEST EQUIPMENT
#51 | 2024-01-25 ✅ Patent 12,625,178 granted on 2026-05-12US20240027523A1
PhysicsAUTOMATIC TEST EQUIPMENT
#52 | 2024-01-25 ✅ Patent 12,553,941 granted on 2026-02-17US20240027521A1
PhysicsAUTOMATIC TEST EQUIPMENT
#53 | 2024-01-25 ✅ Patent 12,578,382 granted on 2026-03-17US20240027520A1
PhysicsAUTOMATIC TEST EQUIPMENT
#54 | 2024-01-25 ✅ Patent 12,025,654 granted on 2024-07-02US20240027519A1
PhysicsElectronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatus
#55 | 2024-01-18 ✅ Patent 12,381,585 granted on 2025-08-05US20240022270A1
ElectricitySIGNAL GENERATOR
#56 | 2024-01-18US20240019295A1
PhysicsULTRASONIC MEASUREMENT APPARATUS, METHOD, AND RECORDING MEDIUM
#57 | 2023-12-28 ✅ Patent 12,276,693 granted on 2025-04-15US20230417826A1
PhysicsElectronic component handling apparatus, electronic component testing apparatus, electronic component testing method
#58 | 2023-12-28 ✅ Patent 12,411,164 granted on 2025-09-09US20230417812A1
PhysicsSIGNAL/NOISE DETERMINATION APPARATUS, METHOD, AND RECORDING MEDIUM
#59 | 2023-12-14 ✅ Patent 12,203,978 granted on 2025-01-21US20230400505A1
PhysicsFlexible sideband support systems and methods
#60 | 2023-12-07 ✅ Patent 12,584,956 granted on 2026-03-24US20230393189A1
PhysicsHEATER DRIVE CONTROLLING APPARATUS, ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTING APPARATUS, AND HEATER DRIVE CONTROLLING METHOD
#61 | 2023-11-30 ✅ Patent 12,546,814 granted on 2026-02-10US20230384361A1
PhysicsCONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATURE
#62 | 2023-11-02 ✅ Patent 12,483,342 granted on 2025-11-25US20230353259A1
ElectricityMEASUREMENT ARRANGEMENT FOR CHARACTERIZING A RADIO FREQUENCY ARRANGEMENT HAVING A PLURALITY OF ANTENNAS
#63 | 2023-11-02 ✅ Patent 12,388,347 granted on 2025-08-12US20230353055A1
ElectricityPOWER SUPPLY APPARATUS
#64 | 2023-10-26 ✅ Patent 12,436,187 granted on 2025-10-07US20230341462A1
PhysicsELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT TEST APPARATUS
#65 | 2023-10-05 ✅ Patent 12,422,472 granted on 2025-09-23US20230314500A1
PhysicsTEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TEST APPARATUS, AND DUT TEMPERATURE CONTROL METHOD
#66 | 2023-09-28 ✅ Patent 12,282,057 granted on 2025-04-22US20230305053A1
PhysicsElectronic component handling apparatus and electronic component testing apparatus
#67 | 2023-09-21 ✅ Patent 12,436,185 granted on 2025-10-07US20230296666A1
PhysicsTEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT TEST APPARATUS
#68 | 2023-08-31 ✅ Patent 12,451,810 granted on 2025-10-21US20230275515A1
ElectricityPOWER SUPPLY DEVICE
#69 | 2023-08-17 ✅ Patent 12,216,559 granted on 2025-02-04US20230259435A1
PhysicsSystems and methods for parallel testing of multiple namespaces located in a plurality of devices under test
#70 | 2023-08-10US20230251304A1
PhysicsELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TESTING APPARATUS
#71 | 2023-07-27 ✅ Patent 12,597,691 granted on 2026-04-07US20230238679A1
ElectricityMULTI-SECTION DIRECTIONAL COUPLER, A METHOD FOR MANUFACTURING A MULTI-SECTION DIRECTIONAL COUPLER AND A METHOD FOR OPERATING A MULTI-SECTION DIRECTIONAL COUPLER
#72 | 2023-06-15 ✅ Patent 12,602,556 granted on 2026-04-14US20230186042A1
PhysicsSYSTEMS AND METHODS FOR DETERMINING A VALID STATE OF MEASUREMENT SYSTEMS
#73 | 2023-06-15 ✅ Patent 12,467,970 granted on 2025-11-11US20230184824A1
PhysicsTEST ARRANGEMENT FOR TESTING ONE OR MORE DEVICES, TEST SUPPORT MODULE FOR SUPPORTING TESTING ONE OR MORE DEVICES, AND METHOD FOR OPERATING AN AUTOMATED TEST EQUIPMENT
#74 | 2023-05-18 ✅ Patent 12,467,973 granted on 2025-11-11US20230152374A1
PhysicsAUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
#75 | 2023-04-27 ✅ Patent 11,693,026 granted on 2023-07-04US20230131189A1
PhysicsTest carrier
#76 | 2023-04-20 ✅ Patent 12,339,308 granted on 2025-06-24US20230119550A1
PhysicsAPPARATUS FOR TESTING A COMPONENT, METHOD OF TESTING THE COMPONENT, COMPUTER-READABLE STORAGE DEVICE FOR IMPLEMENTING THE METHOD, AND TEST ARRANGEMENT USING A MAGNETIC FIELD
#77 | 2023-04-13 ✅ Patent 12,007,428 granted on 2024-06-11US20230111543A1
PhysicsSystems and methods for multidimensional dynamic part average testing
#78 | 2023-04-06 ✅ Patent 11,784,729 granted on 2023-10-10US20230105908A1
ElectricityCalibration device, conversion device, calibration method, and non-transitory computer-readable medium having recorded thereon calibration program
#79 | 2023-04-06 ✅ Patent 12,130,327 granted on 2024-10-29US20230105734A1
PhysicsElectronic component testing apparatus, socket, and carrier
#80 | 2023-03-30 ✅ Patent 12,467,969 granted on 2025-11-11US20230100093A1
PhysicsAUTOMATED TEST EQUIPMENT AND METHOD USING DEVICE SPECIFIC DATA
#81 | 2023-03-30 ✅ Patent 12,306,250 granted on 2025-05-20US20230099503A1
PhysicsIntegrated circuit, an apparatus for testing an integrated circuit, a method for testing an integrated circuit and a computer program for implementing this method using magnetic field
#82 | 2023-03-30 ✅ Patent 12,476,221 granted on 2025-11-18US20230098533A1
ElectricityFABRICATION METHOD OF STACKED DEVICE AND STACKED DEVICE
#83 | 2023-03-23 ✅ Patent 12,259,425 granted on 2025-03-25US20230091333A1
PhysicsCircuit and method for calibrating a plurality of automated test equipment channels
#84 | 2023-03-23 ✅ Patent 11,899,058 granted on 2024-02-13US20230087389A1
PhysicsAutomated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
#85 | 2023-03-09 ✅ Patent 11,899,059 granted on 2024-02-13US20230073119A1
PhysicsAutomated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
#86 | 2023-03-02US20230061634A1
Human necessitiesDISTORTION DISPLAY APPARATUS, METHOD, AND RECORDING MEDIUM
#87 | 2023-02-16 ✅ Patent 12,055,570 granted on 2024-08-06US20230052937A1
PhysicsMeasurement apparatus, measurement method and computer readable medium
#88 | 2023-02-16US20230048446A1
PhysicsOPTICAL TESTING APPARATUS
#89 | 2023-02-07 ✅ Patent 11,573,267 granted on 2023-02-07US17454669
PhysicsElectronic component handling apparatus and electronic component testing apparatus
#90 | 2023-01-26 ✅ Patent 11,579,187 granted on 2023-02-14US20230023699A1
PhysicsTest carrier and electronic component testing apparatus
#91 | 2023-01-19 ✅ Patent 12,568,833 granted on 2026-03-03US20230021125A1
ElectricitySEMICONDUCTOR DEVICE
#92 | 2023-01-19 ✅ Patent 12,329,545 granted on 2025-06-17US20230018890A1
Human necessitiesFILTERING APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM
#93 | 2022-12-22 ✅ Patent 12,040,825 granted on 2024-07-16US20220407548A1
ElectricityFrequency range conversion
#94 | 2022-11-10US20220354082A1
Human necessitiesSOMATIC CELL METER, SOMATIC CELL MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM
#95 | 2022-10-20 ✅ Patent 11,994,552 granted on 2024-05-28US20220334177A1
PhysicsBurn-in board and burn-in apparatus
#96 | 2022-10-20 ✅ Patent 11,719,741 granted on 2023-08-08US20220334173A1
PhysicsBurn-in board and burn-in apparatus
#97 | 2022-10-20US20220333150A1
Chemistry; metallurgyBIOSENSOR, CHANNEL MEMBER USED IN BIOSENSOR, AND METHOD OF USING BIOSENSOR
#98 | 2022-10-13 ✅ Patent 11,789,055 granted on 2023-10-17US20220326290A1
PhysicsTest apparatus of antenna array
#99 | 2022-10-06 ✅ Patent 12,308,503 granted on 2025-05-20US20220320699A1
ElectricityFrequency selective electrical filter
#100 | 2022-09-29 ✅ Patent 12,099,088 granted on 2024-09-24US20220308107A1
PhysicsTest equipment for testing a device under test having an antenna
Also check out Advantest Corporation's (Tokyo, Japan) applicant profile with 493 patent applications submitted.
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