Junwei Wei

City:

Milpitas, California

Country:

United States

Published Applications:

Last publication date:

2018-03-29

Top Assignees for applications by Junwei Wei

The entities that hold a legal rights for patent applications filed by inventor Wei Junwei:

Junwei Wei from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Defect marking for semiconductor wafer inspection

Determining a configuration for an optical element positioned in a collection aperture during wafer inspection

Determining a configuration for an optical element positioned in a collection aperture during wafer inspection

InventorID:

1401344 ⎘