Suwon-si
South Korea
18
2024-05-30
The entities that hold a legal rights for patent applications filed by inventor JUN CHUNGSAM:
CHUNGSAM JUN from Suwon-si, KR has applied for patents for these inventions. The list has both pending applications and granted patents:
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
#2 | 2024-01-18SUBSTRATE INSPECTION METHOD
#3 | 2023-11-30Inspection system of semiconductor wafer and method of driving the same
#4 | 2023-08-24METHOD OF INSPECTING SEMICONDUCTOR DEVICE
#5 | 2023-06-22SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION METHOD USING THE SAME
#6 | 2023-04-20Inspection system of semiconductor wafer and method of driving the same
#7 | 2021-12-23Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation
#8 | 2021-10-28Inspection apparatus for inspecting semiconductor devices using charged particles
#9 | 2018-04-05FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
#10 | 2018-02-22Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same
#11 | 2017-12-21Apparatus and method for measuring thickness
#12 | 2017-10-26Fan-out panel level package and method of fabricating the same
#13 | 2017-07-13METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METHODS INCORPORATING THE SAME
#14 | 2017-06-22Ellipsometer and method of inspecting pattern asymmetry using the same
#15 | 2017-04-04Ellipsometer and method of inspecting pattern asymmetry using the same
#16 | 2016-07-14Method of inspecting semiconductor device and method of fabricating semiconductor device using the same
#17 | 2016-03-24Semiconductor inspection system and methods of inspecting a semiconductor device using the same
#18 | 2016-01-28Method of manufacturing a semiconductor device using semiconductor measurement system
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