Inventor profile of:

Georg Pelz

City:

Ebersberg

Country:

Germany

Published Applications:

16

Last publication date:

2020-02-06

Top Assignees for applications by Georg Pelz

The entities that hold a legal rights for patent applications filed by inventor Pelz Georg:

Recent patent applications by Pelz Georg

Georg Pelz from Ebersberg, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2020-02-06
US20200041687A1
Physics

Method and device for object recognition and analysis

#2 | 2020-02-06
US20200041618A1
Physics

Matrix Light Source and Detector Device for Solid-State Lidar

#3 | 2018-06-28
US20180184495A1
Electricity

Thermal protection for light emitting devices

#4 | 2017-08-24
US20170242948A1
Physics

SENSITIVITY ANALYSIS SYSTEMS AND METHODS USING LOCAL GRADIENTS

#5 | 2017-08-24
US20170242937A1
Physics

SENSITIVITY ANALYSIS SYSTEMS AND METHODS USING ENTROPY

#6 | 2017-03-02
US20170061313A1
Physics

System and Method for Estimating a Performance Metric

#7 | 2016-11-10
US20160329996A1
Electricity

FAILURE SENSITIVITY ANALYSIS

#8 | 2016-08-18
US20160239039A1
Physics

Dynamically adapting device operations to handle changes in power quality

#9 | 2016-04-21
US20160109868A1
Physics

Load driver circuit including load model parameter estimation

#10 | 2015-09-24
US20150269294A1
Physics

Generation of test stimuli

#11 | 2015-08-06
US20150220667A1
Physics

APPLICATION-BASED VERIFICATION COVERAGE USING METAMODELS

#12 | 2015-01-08
US20150012238A1
Physics

Method and device for determining test sets of operating parameter values for an electronic component

#13 | 2014-06-19
US20140172343A1
Physics

Emulation System and Method

#14 | 2013-03-14
US20130066582A1
Physics

Method and device for determining test sets of operating parameter values for an electronic component

#15 | 2011-09-01
US20110210711A1
Electricity

Apparatus for detecting a state of operation of a power semiconductor device

#16 | 2009-11-19
US20090284305A1
Electricity

Apparatus for detecting a state of operation of a power semiconductor device

InventorID:

142697 ⎘