Hirohide Yano

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2022-12-15

Top Assignees for applications by Hirohide Yano

The entities that hold a legal rights for patent applications filed by inventor Yano Hirohide:

Hirohide Yano from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Operation accuracy measuring method

Testing apparatus

Wafer processing method

Wafer inspection method and wafer inspection apparatus

Wafer inspection method and grinding and polishing apparatus

InventorID:

1457767 ⎘