Amandev SINGH

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2021-06-03

Top Assignees for applications by Amandev SINGH

The entities that hold a legal rights for patent applications filed by inventor SINGH Amandev:

Amandev SINGH from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

Metrology apparatus

Measurement system, lithographic system, and method of measuring a target

Method of inspecting a substrate, metrology apparatus, and lithographic system

Method of measuring asymmetry, inspection apparatus, lithographic system and device manufacturing method

Focus monitoring arrangement and inspection apparatus including such an arrangement

Inspection apparatus and methods, methods of manufacturing devices

InventorID:

1494918 ⎘