Chen Dror

City:

Tivon

Country:

Israel

Published Applications:

Last publication date:

2022-05-19

Top Assignees for applications by Chen Dror

The entities that hold a legal rights for patent applications filed by inventor Dror Chen:

Chen Dror from Tivon, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

System and method for error reduction for metrology measurements

Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrology

Metrology target identification, design and verification

Metrology target identification, design and verification

InventorID:

1586782 ⎘