Hayward, California
United States
8
2024-05-30
The entities that hold a legal rights for patent applications filed by inventor Di Ming:
Ming Di from Hayward, US has applied for patents for these inventions. The list has both pending applications and granted patents:
INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION
#2 | 2022-11-03Bandgap measurements of patterned film stacks using spectroscopic metrology
#3 | 2020-09-08Dispersion model for band gap tracking
#4 | 2019-09-10Dispersion model for band gap tracking
#5 | 2019-02-07Bandgap measurements of patterned film stacks using spectroscopic metrology
#6 | 2017-03-14Dispersion model for band gap tracking
#7 | 2015-01-01Calculated electrical performance metrics for process monitoring and yield management
#8 | 2013-01-03Measurement of composition for thin films
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