Inventor profile of:

Boris Golberg

City:

Ashdod

Country:

Israel

Published Applications:

18

Last publication date:

2026-01-08

Top Assignees for applications by Boris Golberg

The entities that hold a legal rights for patent applications filed by inventor Golberg Boris:

Recent patent applications by Golberg Boris

Boris Golberg from Ashdod, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-08
US20260009992A1
Physics

SPLIT ILLUMINATION SYSTEM

#2 | 2025-06-26
US20250208059A1
Physics

MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM

#3 | 2025-02-13
US20250055241A1
Electricity

PULSE STRETCHER SYSTEM AND METHOD

#4 | 2024-08-22
US20240280802A1
Physics

LASER PULSE CASCADE

#5 | 2024-08-22
US20240280506A1
Physics

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULTIPLEXING

#6 | 2024-08-01
US20240255770A1
Physics

POLARIZATION OPTICAL SYSTEM

#7 | 2024-07-11
US20240230530A9
Physics

PHASE RETRIEVAL

#8 | 2024-04-25
US20240133807A1
Physics

PHASE RETRIEVAL

#9 | 2023-10-26
US20230341334A1
Physics

High throughput defect detection

#10 | 2021-12-02
US20210372936A1
Physics

Method and system for obtaining information from a sample

#11 | 2018-07-26
US20180209915A1
Physics

Asymmetrical magnification inspection system and illumination module

#12 | 2018-03-22
US20180081166A1
Physics

Scanning system and method for scanning an object

#13 | 2017-10-26
US20170307539A1
Physics

Inspection system and method for inspecting a sample by using a plurality of spaced apart beams

#14 | 2016-09-08
US20160260642A1
Electricity

System for inspecting and reviewing a sample

#15 | 2008-05-01
US20080100917A1
Physics

Broadband imaging system and method

#16 | 2006-05-30
US10617448
-

Wafer defect detection system with traveling lens multi-beam scanner

#17 | 2006-04-27
US20060087648A1
Physics

System for inspecting a surface employing configurable multi angle illumination modes

#18 | 2005-02-08
US10617449
-

Wafer defect detection system with traveling lens multi-beam scanner

InventorID:

1645122 ⎘