Assignee profile:

Applied Materials, Inc.

City:

Santa Clara, California

Country:

United States

Published Applications:

13,059

Last publication date:

2026-10-08

Patent Grants:

11,031

Last grant date:

2026-10-06

Applied Materials, Inc. is a global leader in the semiconductor and display industries, based in Santa Clara, US. Founded in 1967, the company provides innovative equipment, services and software to enable the manufacture of advanced semiconductor, flat panel display and solar photovoltaic products. Applied Materials has a broad portfolio of products and services that address the full range of manufacturing needs from research and development to manufacturing and process control. The company has operations in more than 30 countries and serves customers in the electronics, energy, healthcare and industrial markets.

Quarterly Applied Materials, Inc. Patent Applications

Top Inventors for applications by Applied Materials, Inc.

These are the the leading inventors for applications assigned to Applied Materials, Inc.:

Recent patent applications by Applied Materials, Inc.

Applied Materials, Inc. based in Santa Clara, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2026-10-08
US20260314357A1
Electricity

METHOD TO IMPROVE INTERCONNECT COEFFICIENT OF THERMAL EXPANSION

#2 | 2026-10-08
US20260314280A1
Electricity

IN SITU NUCLEATION OF DIAMOND FOR THERMAL CONDUCTIVE APPLICATIONS

#3 | 2026-10-08
US20260314278A1
Electricity

TITANIUM NITRIDE GAPFILL PROCESSES FOR SEMICONDUCTOR STRUCTURES

#4 | 2026-10-08
US20260314036A1
Electricity

CONTACT RESISTANCE REDUCTION FOR DIRECT BACKSIDE CONTACT

#5 | 2026-10-08
US20260311953A1
Electricity

PROCESSING SYSTEM FOR GENERATING ION BEAMS HAVING TUNABLE ANGLE

#6 | 2026-10-08
US20260307006A1
Performing operations; transporting

ABATEMENT OF EFFLUENT CONTAINING AMMONIUM CHLORIDE

#7 | 2026-10-01
US20260304735A1
Electricity

SILICON-ON-INSULATOR (SOI) REPLACEMENT FOR 4F2 DRAM USING SACRIFICIAL SILICON GERMANIUM AND BOTTOM-UP DIELECTRIC

#8 | 2026-10-01
US20260302142A1
Electricity

MULTI-ZONE HEATER WITH MINIMUM RF LOSS

#9 | 2026-10-01
US20260297808A1
Chemistry; metallurgy

APPARATUS AND METHOD OF FORMING A COLLOID CONTAINING LAYER

#10 | 2026-09-24
US20260289057A1
Physics

SCALABLE AND DYNAMIC MULTI-MODAL CHIP DESIGN HOTSPOT CLASSIFICATION

#11 | 2026-09-24
US20260286563A1
Chemistry; metallurgy

SYSTEMS AND METHODS FOR RINSING ELECTROPLATING ROTORS

#12 | 2026-09-17
US20260282951A1
Electricity

MODULAR COAXIAL BRIDGE

#13 | 2026-09-17
US20260282856A1
Electricity

RUTHENIUM SEEDING FOR CORROSION FREE MOLYBDENUM GROWTH

#14 | 2026-09-17
US20260282773A1
Electricity

METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES

#15 | 2026-09-17
US20260282506A1
Electricity

EPITAXIAL LAYER DEPOSITION FOR SEMICONDUCTOR DEVICES

#16 | 2026-09-17
US20260282480A1
Electricity

METHOD OF REDUCING METAL GATE RESISTANCE FOR NEXT GENERATION NMOS DEVICE APPLICATION

#17 | 2026-09-17
US20260282317A1
Electricity

ROTATED 3D DRAM CELL

#18 | 2026-09-10
US20260271692A1
Electricity

IN-TRENCH QUALITY IMPROVEMENT OF SILICON-AND-OXYGEN-CONTAINING MATERIALS

#19 | 2026-09-10
US20260271678A1
Electricity

Methods for Reshaping Masking Layer Openings

#20 | 2026-09-10
US20260271641A1
Electricity

SELECTIVE TANTALUM NITRIDE DEPOSITION FOR BARRIER APPLICATIONS

#21 | 2026-09-10
US20260271635A1
Electricity

ATOMIC LAYER DEPOSITION WITH CARBON INHIBITION PROFILE TUNING

#22 | 2026-09-10
US20260271173A1
Electricity

RESONATOR COIL PITCH ADJUSTMENT SYSTEMS AND METHODS

#23 | 2026-09-10
US20260269182A1
Electricity

SYSTEM AND METHOD FOR ADJUSTING AN ION BEAM

#24 | 2026-09-10
US20260265906A1
Chemistry; metallurgy

SEAM FREE MOLYBDENUM GAP FILL

#25 | 2026-09-03
US20260262470A1
Electricity

WAFER PLACEMENT SENSORS FOR SUBSTRATE RINSE SYSTEM

#26 | 2026-09-03
US20260260849A1
Electricity

METHOD AND APPARATUS FOR GENERATING PLASMA WITH ION BLOCKER PLATE

#27 | 2026-09-03
US20260258553A1
Chemistry; metallurgy

METHODS FOR ATOMIC LAYER DEPOSITION OF SiCO(N) USING HALOGENATED SILYLAMIDES

#28 | 2026-08-27
US20260255895A1
Electricity

METHODS OF DEPOSITING SiCON WITH C, O AND N COMPOSITIONAL CONTROL

#29 | 2026-08-27
US20260255660A1
Electricity

VERTICAL DEVICE FORMED BY SELF-ALIGNED SEQUENTIAL PATTERNING OF TOP TRANSISTOR AND BOTTOM TRANSISTOR

#30 | 2026-08-27
US20260255654A1
Electricity

MULTI-THRESHOLD VOLTAGE INTEGRATION SCHEME FOR SEMICONDUCTOR DEVICES

#31 | 2026-08-27
US20260255645A1
Electricity

LOW TEMPERATURE N-TYPE CONTACT EPI FORMATION

#32 | 2026-08-27
US20260255618A1
Electricity

LINER TO FORM COMPOSITE HIGH-K DIELECTRIC

#33 | 2026-08-27
US20260255587A1
Electricity

SUPPORT LAYER FOR SMALL PITCH FILL

#34 | 2026-08-27
US20260254432A1
Electricity

TUNABLE IMPEDANCE MATCHING METHODS AND CIRCUITS FOR PROTECTION AGAINST SIDE-CHANNEL ATTACKS

#35 | 2026-08-27
US20260253845A1
Electricity

GAS DISTRIBUTION ASSEMBLIES FOR SEMICONDUCTOR DEVICES

#36 | 2026-08-27
US20260249209A1
Performing operations; transporting

SYSTEM TO COLLECT, RECOVER AND RECYCLE CHEMICAL EXHAUST FROM SEMICONDUCTOR PROCESSING CHAMBERS

#37 | 2026-08-20
US20260247907A1
Electricity

THIN FILM-BASED SENSOR ARRAY

#38 | 2026-08-20
US20260247885A1
Electricity

LOCALIZED FILM STRESS MODULATION BY IMPLANT

#39 | 2026-08-20
US20260247866A1
Electricity

RECONFIGURABLE SYSTEMS BY SHIFTING MATERIALS INSIDE A CAVITY

#40 | 2026-08-20
US20260245845A1
Electricity

METHODS AND SYSTEMS FOR ARC SUPPRESSION DURING SEMICONDUCTOR FABRICATION PROCESSES

#41 | 2026-08-20
US20260245833A1
Electricity

MULTI-ZONE RF FOR WAFER EDGE PLASMA PROFILE TUNING

#42 | 2026-08-20
US20260242934A1
Chemistry; metallurgy

METAL DEPOSITION FOR VOIDLESS GAP FILL

#43 | 2026-08-13
US20260239945A1
Electricity

Trench Tip Squaring in Self-Aligned Multi-Patterning Process

#44 | 2026-08-13
US20260239901A1
Electricity

DIE STRESS MODULATION FOR IMPROVED DEVICE LAYER STACKING

#45 | 2026-08-13
US20260239699A1
Electricity

ETCH STOP LAYER FOR 3D MEMORY

#46 | 2026-08-13
US20260237601A1
Electricity

APPARATUS AND TECHNIQUES FOR SUBSTRATE PROCESSING USING INDEPENDENT ION SOURCE AND RADICAL SOURCE

#47 | 2026-08-13
US20260237048A1
Physics

METHOD FOR DETERMINING WAFER UNIFORMITY

#48 | 2026-08-13
US20260234792A1
Chemistry; metallurgy

IN SITU CLEANING OF DEPOSITION CHAMBER WITH MICROWAVE PLASMA

#49 | 2026-08-13
US20260234790A1
Chemistry; metallurgy

Surface Treatment For Selective Deposition

#50 | 2026-08-13
US20260233946A1
Performing operations; transporting

COMPLIANT END-EFFECTOR FOR LOW-PARTICLE ATMOSPHERIC HANDLING OF WARPED WAFERS

#51 | 2026-08-06
US20260231757A1
Electricity

POWER DELIVERY FOR AI COMPUTING WITH ORTHOGONAL EMBEDDING AND EDGE ACCESS

#52 | 2026-08-06
US20260229464A1
Electricity

PROTECTION TREATMENTS FOR SURFACES OF SEMICONDUCTOR FABRICATION EQUIPMENT

#53 | 2026-08-06
US20260229394A1
Electricity

MAGNETIC THIN FILM PROCESS CHAMBER DESIGN FOR HIGH-DENSITY POWER CONVERTERS

#54 | 2026-08-06
US20260226611A1
Chemistry; metallurgy

HALIDE-FREE CO-REACTANTS FOR RUTHENIUM FILM DEPOSITION

#55 | 2026-07-30
US20260223622A1
Electricity

BOTTOM PURGE FOR SEMICONDUCTOR PROCESSING SYSTEM

#56 | 2026-07-23
US20260215260A1
Electricity

FLEXIBLE HEATSINK INTERFACE

#57 | 2026-07-23
US20260215197A1
Electricity

WAFER BACKSIDE DEPOSITION CLEANING

#58 | 2026-07-23
US20260215183A1
Electricity

CAVITY CONTACT FORMATION USING PLASMA DOPING PROCESS

#59 | 2026-07-23
US20260215181A1
Electricity

SUBSTRATE STRESS MANAGEMENT USING HIGH TEMPERATURE IMPLANTATION

#60 | 2026-07-23
US20260213139A1
Electricity

RESISTIVITY-CONTROLLED DIELECTRIC MATERIALS FOR SUBSTRATE SUPPORTS WITH IMPROVED HIGH TEMPERATURE CHUCKING

#61 | 2026-07-23
US20260209943A1
Chemistry; metallurgy

HIGH HEAT LOSS HEATER AND ELECTROSTATIC CHUCK FOR SEMICONDUCTOR PROCESSING

#62 | 2026-07-16
US20260204513A1
Electricity

ION IMPLANTER AND METHOD OF ION BEAM CONTROL USING ION BEAM IMAGING SYSTEM

#63 | 2026-07-09
US20260198247A1
Electricity

SEMICONDUCTOR PROCESSING CHAMBER ADAPTER

#64 | 2026-07-09
US20260198236A1
Electricity

SEMICONDUCTOR FILM PLATING PERIMETER MAPPING AND COMPENSATION

#65 | 2026-07-09
US20260196453A1
Electricity

MULTI-PORT CROSS FLOW SYSTEM

#66 | 2026-07-09
US20260196452A1
Electricity

BIPOLAR ELECTROSTATIC CHUCK ELECTRODE DESIGNS

#67 | 2026-07-09
US20260193776A1
Chemistry; metallurgy

AMPOULE FOR A SEMICONDUCTOR MANUFACTURING PRECURSOR

#68 | 2026-07-09
US20260192399A1
Performing operations; transporting

LASER ABLATION OF ELECTROSTATIC CHUCKS

#69 | 2026-07-02
US20260190929A1
Electricity

Cassette for Vapor Processing Chamber

#70 | 2026-06-25
US20260182290A1
Electricity

INTEGRATED WET CLEAN FOR GATE STACK DEVELOPMENT

#71 | 2026-06-25
US20260181903A1
Electricity

GRAIN GROWTH OF SILICON BY METAL INDUCED CRYSTALLIZATION

#72 | 2026-06-25
US20260181765A1
Electricity

PHASE MEASUREMENT AND CONTROL IN LINEAR ACCLERATOR

#73 | 2026-06-25
US20260176747A1
Chemistry; metallurgy

DEPOSITION OF HALIDE-FREE METAL FILMS USING NOBLE METAL CATALYSTS

#74 | 2026-06-18
US20260173826A1
Electricity

ION IMPLANTATION AND VACUUM BAKE OF EXTREME ULTRAVIOLET PHOTORESIST TO IMPROVE FINE PATTERNING PERFORMANCE

#75 | 2026-06-18
US20260173815A1
Electricity

CONTROLLING TEMPERATURE UNIFORMITY OF A WAFER USING A WAFER PEDESTAL SHIELDING ELEMENT

#76 | 2026-06-18
US20260173806A1
Electricity

WAFER FIXED CHARGE CONTROL IN PHYSICAL VAPOR DEPOSITION

#77 | 2026-06-18
US20260173782A1
Electricity

ANGLED IMPLANT FOR PATTERNING FEATURE SURFACE ROUGHNESS IMPROVEMENT

#78 | 2026-06-18
US20260173335A1
Electricity

TWO-PIECE RF SHIELD DESIGN

#79 | 2026-06-18
US20260170653A1
Physics

MULTI-STAGE MACHINE VISION TECHNIQUE FOR ANALYZING IMAGES OF OBJECTS

#80 | 2026-06-18
US20260168102A1
Chemistry; metallurgy

HYDROGEN ADDITION TO LOW-K DIELECTRIC BARRIER FILMS

#81 | 2026-06-18
US20260168096A1
Chemistry; metallurgy

METHOD OF FORMING INTERCONNECT STRUCTURE

#82 | 2026-06-11
US20260165142A1
Electricity

HIGHLY-EFFECTIVE ULTRATHIN SPUTTER ABLE AND TAMPER-RESISTANT SHIELDS WITH METAL-REFRACTORY ALLOY STACKS

#83 | 2026-06-11
US20260165102A1
Electricity

PLASMA TREATMENT PROCESSES FOR MICROELECTRONIC DEVICE MANUFACTURE

#84 | 2026-06-11
US20260165046A1
Electricity

PLASMA TREATMENT PROCESSES FOR SELECTIVE DEPOSITION

#85 | 2026-06-11
US20260165045A1
Electricity

SELECTIVE DEPOSITION OF SILICON NITRIDE

#86 | 2026-06-11
US20260164817A1
Electricity

METHOD OF FORMING IMAGE SENSOR INCLUDING AIR GRID

#87 | 2026-06-11
US20260159950A1
Chemistry; metallurgy

NOTCHED SUSCEPTOR DESIGN FOR STABLE SHADOW FRAME

#88 | 2026-06-11
US20260159944A1
Chemistry; metallurgy

SELECTIVE DEPOSITION OF SILICON NITRIDE

#89 | 2026-05-28
US20260150649A1
Electricity

GATE ALL AROUND BACKSIDE POWER RAIL FORMATION WITH MULTI-COLOR BACKSIDE DIELECTRIC ISOLATION SCHEME

#90 | 2026-05-28
US20260150612A1
Electricity

SURFACE CONDITIONING PROCESSES FOR SEMICONDUCTOR PROCESSING CHAMBER PARTS

#91 | 2026-05-28
US20260150601A1
Electricity

Modifying Openings of an Extreme Ultraviolet Masking Layer

#92 | 2026-05-28
US20260150179A1
Electricity

SYSTEM AND METHOD FOR RESONATOR TUNING USING VARIABLE CAPACITOR

#93 | 2026-05-28
US20260148933A1
Electricity

SUBSTRATE PROPERTY CONTROL USING DOSE-DEPENDENT RESPONSE

#94 | 2026-05-28
US20260148932A1
Electricity

SCANNED BEAM DOSE RATE MEASUREMENT FOR ION BEAM OPTIMIZATION

#95 | 2026-05-28
US20260147270A1
Physics

LINE CD MODULATION AND END-TO-END CD MANIPULATION WITH ANGLED ETCH & DEPOSITION

#96 | 2026-05-28
US20260146334A1
Chemistry; metallurgy

INTEGRATED WET CLEAN FOR BEVEL TREATMENTS

#97 | 2026-05-28
US20260145295A1
Performing operations; transporting

SUBSTRATE POLISHING HEAD FOR OPTICAL ENHANCEMENT ANALYSIS

#98 | 2026-05-28
US20260145269A1
Performing operations; transporting

MASK WRITING SYSTEM, BEAM SHAPING MODULE AND METHOD OF LASER BEAM PROCESSING

#99 | 2026-05-21
US20260143984A1
Electricity

SELECTIVE ETCHING OF SILICON-CONTAINING MATERIAL RELATIVE TO METAL-DOPED BORON FILMS

#100 | 2026-05-21
US20260143980A1
Electricity

ANGLED ION IMPLANT TO ENABLE VOID-FREE FILLING OF HIGH ASPECT RATIO TRENCH

Also check out Applied Materials, Inc.'s (Santa Clara, United States) applicant profile with 9,650 patent applications submitted.

AssigneeID:

343 ⎘