Hod Hasharon
Israel
32
2026-04-16
The entities that hold a legal rights for patent applications filed by inventor Shemesh Dror:
Dror Shemesh from Hod Hasharon, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
MATERIAL CHARACTERIZATION USING GREY LEVEL MEASUREMENT AND X-RAY CHARACTERIZATION
#2 | 2025-07-17NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON GROUND TRUTH MEASUREMENTS
#3 | 2025-07-03NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON SIMULATIONS AND GROUND TRUTH MEASUREMENTS
#4 | 2025-04-24NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS
#5 | 2024-08-01NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATURE MEASUREMENTS
#6 | 2024-03-21NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
#7 | 2024-03-21NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
#8 | 2024-03-14Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
#9 | 2024-03-14DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
#10 | 2023-04-13Defect examination on a semiconductor specimen
#11 | 2021-08-19Determination of defect location for examination of a specimen
#12 | 2021-06-17X-ray based evaluation of a status of a structure of a substrate
#13 | 2021-02-04X-ray based evaluation of a status of a structure of a substrate
#14 | 2020-11-12Process monitoring
#15 | 2019-06-13Imaging of crystalline defects
#16 | 2019-02-07Method for detecting voids and an inspection system
#17 | 2018-02-20Resolving ambiguities in an energy spectrum
#18 | 2017-10-31Method for detecting voids in interconnects and an inspection system
#19 | 2016-09-22System and method for scanning an object
#20 | 2012-09-27METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON MICROSCOPE
#21 | 2009-03-26Method and system for generating and reviewing a thin sample
#22 | 2009-02-26Method and system for imaging a cross section of a specimen
#23 | 2008-10-23Charged particle beam apparatus and method for operating a charged particle beam apparatus
#24 | 2008-09-25Method and system for providing a compensated auger spectrum
#25 | 2008-08-14Charged particle detector assembly, charged particle beam apparatus and method for generating an image
#26 | 2007-06-19Multiple electrode lens arrangement and a method for inspecting an object
#27 | 2007-05-24Method and system for detecting hidden defects
#28 | 2007-04-26METHOD AND SYSTEM FOR ENHANCING RESOLUTION OF A SCANNING ELECTRON MICROSCOPE
#29 | 2006-09-28Method for monitoring chamber cleanliness
#30 | 2006-01-19Method and apparatus for sample formation and microanalysis in a vacuum chamber
#31 | 2006-01-19Apparatus for sample formation and microanalysis in a vacuum chamber
#32 | 2005-01-27System and method for fast focal length alterations
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