Vallejo, California
United States
8
2025-07-24
The entities that hold a legal rights for patent applications filed by inventor Sanko Dimitry:
Dimitry Sanko from Vallejo, US has applied for patents for these inventions. The list has both pending applications and granted patents:
OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STRUCTURES WITH RANDOMNESS
#2 | 2025-05-08OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STRUCTURES WITH RANDOMNESS
#3 | 2024-01-18System and method for determining target feature focus in image-based overlay metrology
#4 | 2023-08-17Estimating in-die overlay with tool induced shift correction
#5 | 2023-07-13Self-calibrating overlay metrology
#6 | 2022-12-29Self-calibrated overlay metrology using a skew training sample
#7 | 2022-11-10Self-calibrating overlay metrology
#8 | 2017-02-16Process-sensitive metrology systems and methods
1799398 ⎘