Mountain View, California
United States
7
2017-03-16
The entities that hold a legal rights for patent applications filed by inventor McCord Mark:
Mark McCord from Mountain View, US has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE
#2 | 2010-12-30Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer
#3 | 2009-02-12Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer
#4 | 2008-07-10Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions
#5 | 2007-10-04Method and apparatus for inspecting a substrate
#6 | 2007-02-01Method and apparatus for inspecting a substrate
#7 | 2007-01-30Method and apparatus for inspecting a substrate
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