Inventor profile of:

Nan LIN

City:

Eindhoven

Country:

Netherlands

Published Applications:

16

Last publication date:

2024-01-04

Top Assignees for applications by Nan LIN

The entities that hold a legal rights for patent applications filed by inventor LIN Nan:

Recent patent applications by LIN Nan

Nan LIN from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-01-04
US20240004312A1
Physics

METROLOGY APPARATUS BASED ON HIGH HARMONIC GENERATION AND ASSOCIATED METHOD

#2 | 2023-09-14
US20230288818A1
Physics

AN ILLUMINATION SOURCE AND ASSOCIATED METROLOGY APPARATUS

#3 | 2022-12-01
US20220382124A1
Physics

Illumination source and associated metrology apparatus

#4 | 2022-10-13
US20220326152A1
Physics

AN IMPROVED HIGH HARMONIC GENERATION APPARATUS

#5 | 2019-07-11
US20190212657A1
Physics

Apparatus for delivering gas and illumination source for generating high harmonic radiation

#6 | 2019-05-23
US20190155171A1
Physics

HHG source, inspection apparatus and method for performing a measurement

#7 | 2019-02-14
US20190049861A1
Physics

Methods and Apparatus for Determining the Position of a Spot of Radiation, Inspection Apparatus, Device Manufacturing Method

#8 | 2019-01-03
US20190003981A1
Physics

Illumination source for an inspection apparatus, inspection apparatus and inspection method

#9 | 2018-09-20
US20180267411A1
Physics

Apparatus for delivering gas and illumination source for generating high harmonic radiation

#10 | 2018-08-09
US20180224753A1
Physics

Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus

#11 | 2018-03-15
US20180073992A1
Physics

Illumination source for an inspection apparatus, inspection apparatus and inspection method

#12 | 2018-01-11
US20180011029A1
Physics

Illumination source for an inspection apparatus, inspection apparatus and inspection method

#13 | 2017-11-09
US20170322497A1
Physics

Method and apparatus for generating illuminating radiation

#14 | 2017-11-02
US20170315456A1
Physics

HHG source, inspection apparatus and method for performing a measurement

#15 | 2017-11-02
US20170315055A1
Physics

Method and apparatus for determining the property of a structure, device manufacturing method

#16 | 2017-06-29
US20170184511A1
Physics

Lithographic apparatus and method for performing a measurement

InventorID:

1916881 ⎘