Eindhoven
Netherlands
23
2026-04-09
The entities that hold a legal rights for patent applications filed by inventor Janssen Bart Jozef:
Bart Jozef Janssen from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
DARK CORRECTION FOR LONG TERM ACQUISITION
#2 | 2023-11-23Rotating sample holder for random angle sampling in tomography
#3 | 2023-09-21Method and system for generating a diffraction image
#4 | 2023-08-31Measurement and correction of optical aberrations in charged particle beam microscopy
#5 | 2023-01-19Method and system for generating a diffraction image
#6 | 2023-01-05Defective pixel management in charged particle microscopy
#7 | 2022-06-30Stroboscopic illumination synchronized electron detection and imaging
#8 | 2022-05-19Rotating sample holder for random angle sampling in tomography
#9 | 2022-03-31Method and system for high speed signal processing
#10 | 2021-10-14Rotating sample holder for random angle sampling in tomography
#11 | 2021-01-21Method of manufacturing a charged particle detector
#12 | 2020-05-28Method of imaging a sample using an electron microscope
#13 | 2019-11-28Pulse processing
#14 | 2019-09-26Intelligent pre-scan in scanning transmission charged particle microscopy
#15 | 2019-07-25Innovative imaging technique in transmission charged particle microscopy
#16 | 2019-03-07Method for detecting particulate radiation
#17 | 2018-07-03Innovative image processing in charged particle microscopy
#18 | 2018-01-18Method of imaging a specimen using ptychography
#19 | 2017-05-11Method for detecting particulate radiation
#20 | 2016-09-01Pulse processing
#21 | 2015-06-18Method of investigating the wavefront of a charged-particle beam
#22 | 2014-01-02Method of preparing and imaging a lamella in a particle-optical apparatus
#23 | 2013-04-18Method for acquiring data with an image sensor
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