Vught
Netherlands
12
2025-10-02
The entities that hold a legal rights for patent applications filed by inventor COENEN Teis Johan:
Teis Johan COENEN from Vught, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD FOR PARAMETER RECONSTRUCTION OF A METROLOGY DEVICE AND ASSOCIATED METROLOGY DEVICE
#2 | 2025-05-29APPARATUS AND METHODS FOR FILTERING MEASUREMENT RADIATION
#3 | 2023-11-02METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
#4 | 2023-03-30Metrology measurement method and apparatus
#5 | 2023-02-09METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED CIRCUITS AND ASSOCIATED APPARATUSES
#6 | 2022-07-07METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
#7 | 2021-10-21Particle beam apparatus, defect repair method, lithographic exposure process and lithographic system
#8 | 2020-06-25Methods and apparatus for metrology
#9 | 2020-03-26Method and apparatus for determining a radiation beam intensity profile
#10 | 2019-07-04Metrology apparatus for and a method of determining a characteristic of interest of a structure on a substrate
#11 | 2019-01-24Determining an edge roughness parameter of a periodic structure
#12 | 2017-08-17Radiation source
1961898 ⎘