Austin, Texas
United States
21
2024-08-29
The entities that hold a legal rights for patent applications filed by inventor Kuznetsov Alexander:
Alexander Kuznetsov from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Soft X-Ray Optics With Improved Filtering
#2 | 2024-05-02Methods And Systems For Monitoring Metrology Fleet Productivity
#3 | 2023-04-27Continuous Machine Learning Model Training for Semiconductor Manufacturing
#4 | 2022-12-29Self-calibrated overlay metrology using a skew training sample
#5 | 2022-11-10Self-calibrating overlay metrology
#6 | 2021-12-30Soft x-ray optics with improved filtering
#7 | 2021-10-07Soft x-ray optics with improved filtering
#8 | 2021-07-08Methods and systems for overlay measurement based on soft X-ray Scatterometry
#9 | 2021-03-04Methods and systems for semiconductor metrology based on wavelength resolved soft X-ray reflectometry
#10 | 2021-02-25Systems and methods for combined reflectometry and photoelectron spectroscopy
#11 | 2020-07-30Methods and systems for co-located metrology
#12 | 2019-10-03Multilayer targets for calibration and alignment of X-ray based measurement systems
#13 | 2019-09-19Measurement models of nanowire semiconductor structures based on re-useable sub-structures
#14 | 2019-07-11Semiconductor metrology and defect classification using electron microscopy
#15 | 2019-07-11Systems and methods for combined x-ray reflectometry and photoelectron spectroscopy
#16 | 2019-06-13Measurement methodology of advanced nanostructures
#17 | 2019-02-14On-device metrology using target decomposition
#18 | 2019-01-17Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction
#19 | 2018-11-15Methods and systems for characterization of an x-ray beam with high spatial resolution
#20 | 2018-04-26Hybrid metrology for patterned wafer characterization
#21 | 2017-10-05Semiconductor metrology with information from multiple processing steps
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