Berkeley, California
United States
9
2024-08-29
The entities that hold a legal rights for patent applications filed by inventor Artemiev Nikolay:
Nikolay Artemiev from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Soft X-Ray Optics With Improved Filtering
#2 | 2021-12-30Soft x-ray optics with improved filtering
#3 | 2021-10-07Soft x-ray optics with improved filtering
#4 | 2019-10-03Multilayer targets for calibration and alignment of X-ray based measurement systems
#5 | 2019-01-17Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction
#6 | 2018-11-15Methods and systems for characterization of an x-ray beam with high spatial resolution
#7 | 2018-07-05X-ray zoom lens for small angle x-ray scatterometry
#8 | 2018-04-26Calibration of a small angle X-ray scatterometry based metrology system
#9 | 2017-10-26Beam shaping slit for small spot size transmission small angle X-ray scatterometry
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