Austin, Texas
United States
6
2025-07-10
The entities that hold a legal rights for patent applications filed by inventor Hurd Trace:
Trace Hurd from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
INTEGRATED OPTICAL NANOTHERMOMETRY FOR REAL-TIME WAFER TEMPERATURE MONITORING DURING PROCESSING
#2 | 2023-03-23System and methods for wafer drying
#3 | 2021-09-16System and methods for wafer drying
#4 | 2020-01-23Etching of silicon nitride and silica deposition control in 3D NAND structures
#5 | 2019-06-20Aqueous cleaning solution and method of protecting features on a substrate during etch residue removal
#6 | 2017-11-30ATOMIC LAYER ETCHING SYSTEMS AND METHODS
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