Eersel
Netherlands
9
2024-04-18
The entities that hold a legal rights for patent applications filed by inventor RISPENS Gijsbert:
Gijsbert RISPENS from Eersel, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
PROCESS WINDOW BASED ON DEFECT PROBABILITY
#2 | 2024-01-04MEMBRANE FOR EUV LITHOGRAPHY
#3 | 2021-11-18Process window based on defect probability
#4 | 2021-04-15Membrane for EUV lithography
#5 | 2021-01-21Process window based on defect probability
#6 | 2020-05-28Method for removing photosensitive material on a substrate
#7 | 2019-11-07Lithographic patterning process and resists to use therein
#8 | 2019-05-02Membrane for EUV lithography
#9 | 2018-01-04Lithographic patterning process and resists to use therein
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