Milpitas, California
United States
14
2026-06-04
The entities that hold a legal rights for patent applications filed by inventor Chouaib Houssam:
Houssam Chouaib from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods And Systems For Measurement Of Large Dimension Structures Fabricated Using Semiconductor Processing Techniques
#2 | 2025-12-04Methods And Systems For Measurement Of Semiconductor Structures With Mechanical Stress Modulation
#3 | 2025-07-24OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STRUCTURES WITH RANDOMNESS
#4 | 2025-07-10Measurements Of Semiconductor Structures Based On Data Collected At Prior Process Steps
#5 | 2025-05-08OPTICAL AND X-RAY METROLOGY METHODS FOR PATTERNED SEMICONDUCTOR STRUCTURES WITH RANDOMNESS
#6 | 2025-05-08TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SPECTROSCOPIC ELLIPSOMETRY AND RAMAN JOINT MEASUREMENT
#7 | 2025-02-13Flexible Measurement Models For Model Based Measurements Of Semiconductor Structures
#8 | 2025-01-09Multiple Pass Optical Measurements Of Semiconductor Structures
#9 | 2024-05-09Methods And Systems For Measurement Of Semiconductor Structures Based On Derivative Measurement Signals
#10 | 2021-09-23Scatterometry based methods and systems for measurement of strain in semiconductor structures
#11 | 2020-06-25Scatterometry based methods and systems for measurement of strain in semiconductor structures
#12 | 2019-09-19Measurement models of nanowire semiconductor structures based on re-useable sub-structures
#13 | 2019-06-13Measurement methodology of advanced nanostructures
#14 | 2018-03-01Model based optical measurements of semiconductor structures with anisotropic dielectric permittivity
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