Eindhoven
Netherlands
3
2022-05-19
The entities that hold a legal rights for patent applications filed by inventor VAN DE RUIT Kevin:
Kevin VAN DE RUIT from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method of determining a set of metrology points on a substrate, associated apparatus and computer program
#2 | 2019-12-19METHOD OF DETERMINING PELLICLE DEGRADATION COMPENSATION CORRECTIONS, AND ASSOCIATED LITHOGRAPHIC APPARATUS AND COMPUTER PROGRAM
#3 | 2018-04-05Lithographic apparatus and lithographic projection method
2158047 ⎘