Ashqelon
Israel
11
2026-07-02
The entities that hold a legal rights for patent applications filed by inventor Hajaj Eitan:
Eitan Hajaj from Ashqelon, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
SPECTRAL OVERLAY TARGET
#2 | 2026-06-04OVERLAY METROLOGY TARGET
#3 | 2025-08-28SIDE-BY-SIDE OFF-CENTER DIE OVERLAY TARGET
#4 | 2024-04-11Targets for diffraction-based overlay error metrology
#5 | 2024-02-29MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY
#6 | 2023-10-12Overlay mark design for electron beam overlay
#7 | 2022-12-29Overlay mark design for electron beam overlay
#8 | 2022-12-29Overlay mark design for electron beam overlay
#9 | 2022-12-29Overlay design for electron beam and scatterometry overlay measurements
#10 | 2022-10-20Multi-resolution overlay metrology targets
#11 | 2018-06-07Process compatibility improvement by fill factor modulation
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