Inventor profile of:

Toralf GRUNER

City:

Aalen

Country:

Germany

Published Applications:

25

Last publication date:

2026-03-12

Top Assignees for applications by Toralf GRUNER

The entities that hold a legal rights for patent applications filed by inventor GRUNER Toralf:

Recent patent applications by GRUNER Toralf

Toralf GRUNER from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-12
US20260072364A1
Physics

METHOD FOR PRODUCING AN OPTICAL IMAGING SYSTEM FOR A MICROLITHOGRAPHY APPARATUS

#2 | 2025-07-03
US20250216792A1
Physics

METHOD FOR OPERATING A PROJECTION EXPOSURE SYSTEM

#3 | 2025-02-06
US20250044712A1
Physics

OPTICAL COMPONENT FOR A LITHOGRAPHY APPARATUS

#4 | 2024-08-29
US20240288784A1
Physics

OPTICAL SYSTEM, PROJECTION EXPOSURE SYSTEM AND METHOD

#5 | 2023-11-16
US20230367231A1
Physics

METHOD OF SETTING UP A PROJECTION EXPOSURE SYSTEM, A PROJECTION EXPOSURE METHOD AND A PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY

#6 | 2023-10-12
US20230324648A1
Physics

OPTICAL SYSTEM, AND METHOD FOR OPERATING AN OPTICAL SYSTEM

#7 | 2023-04-20
US20230122333A1
Physics

Mirror, in particular for a microlithographic projection exposure apparatus

#8 | 2022-07-28
US20220236139A1
Physics

Method and device for characterizing the surface shape of an optical element

#9 | 2022-04-14
US20220113634A1
Physics

Mirror, in particular for a microlithographic projection exposure apparatus

#10 | 2021-05-20
US20210149310A1
Physics

Mirror for a microlithographic projection exposure apparatus, and method for operating a deformable mirror

#11 | 2021-02-25
US20210055662A1
Physics

Mirror, in particular for a microlithographic projection exposure system

#12 | 2020-12-17
US20200393673A1
Physics

Optical element, and method for correcting the wavefront effect of an optical element

#13 | 2020-06-04
US20200174379A1
Physics

Mirror, in particular for a microlithographic projection exposure system

#14 | 2020-01-23
US20200026195A1
Physics

Mirror, in particular for a microlithographic projection exposure apparatus

#15 | 2019-04-11
US20190107784A1
Physics

PROJECTION LENS WITH A MEASUREMENT BEAM PATH

#16 | 2018-06-14
US20180164581A1
Physics

Mirror arrangement for lithography exposure apparatus and optical system comprising mirror arrangement

#17 | 2008-08-14
US20080192225A1
Physics

Projection exposure system, method for manufacturing a micro-structured structural member by the aid of such a projection exposure system and polarization-optical element adapted for use in such a system

#18 | 2006-11-02
US20060244941A1
Physics

Device for adjusting the illumination dose on a photosensitive layer

#19 | 2006-09-28
US20060215272A1
Physics

Objective in a microlithographic projection exposure apparatus

#20 | 2006-07-06
US20060146427A1
Physics

Method for improving the imaging properties of at least two optical elements and photolithographic fabrication method

#21 | 2006-06-08
US20060119750A1
Physics

Optical system for ultraviolet light

#22 | 2005-11-17
US20050254773A1
Physics

Method for improving the imaging properties of at least two optical elements and photolithographic fabrication method

#23 | 2005-08-04
US20050170748A1
Physics

Lens made of a crystalline material

#24 | 2005-01-27
US20050018312A1
Physics

Projection lens for a microlithographic projection exposure apparatus

#25 | 2005-01-06
US20050002111A1
Physics

Microlithographic illumination method and a projection lens for carrying out the method

InventorID:

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