Eindhoven
Netherlands
18
2025-12-25
The entities that hold a legal rights for patent applications filed by inventor MASLOW Mark John:
Mark John MASLOW from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPECTION USING MACHINE LEARNING
#2 | 2025-07-24METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVELOPMENT IMAGE
#3 | 2024-04-04A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTOR DEVICES
#4 | 2024-01-11Method of determining control parameters of a device manufacturing process
#5 | 2024-01-04METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS
#6 | 2023-02-23Method of determining control parameters of a device manufacturing process
#7 | 2023-02-09SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA
#8 | 2022-11-24SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPECTION USING MACHINE LEARNING
#9 | 2022-10-27METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVELOPMENT IMAGE
#10 | 2022-10-13Deep learning for semantic segmentation of pattern
#11 | 2022-03-31Method for characterizing a manufacturing process of semiconductor devices
#12 | 2021-12-02Deep learning for semantic segmentation of pattern
#13 | 2021-05-20Method of determining control parameters of a device manufacturing process
#14 | 2020-04-23Method and system to monitor a process apparatus
#15 | 2019-07-11METHOD AND APPARATUS TO MONITOR A PROCESS APPARATUS
#16 | 2019-06-27Method and system to monitor a process apparatus
#17 | 2019-03-21Separation of contributions to metrology data
#18 | 2018-08-09Process window tracker
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