Christopher Ausschnitt

City:

Heverlee

Country:

Belgium

Published Applications:

Last publication date:

2020-07-23

Top Assignees for applications by Christopher Ausschnitt

The entities that hold a legal rights for patent applications filed by inventor Ausschnitt Christopher:

IMEC VZW 3 Leuven, Belgium

Recent patent applications by Ausschnitt Christopher

Christopher Ausschnitt from Heverlee, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2020-07-23

US20200233317A1

Physics

Metrology method for a semiconductor manufacturing process

#2 | 2020-02-13

US20200050112A1

Physics

Method and Apparatus for Semiconductor Manufacturing

#3 | 2019-05-09

US20190137881A1

Physics

Method and apparatus for semiconductor manufacturing

#4 | 2018-10-04

US20180284624A1

Physics

Metrology method for a semiconductor manufacturing process

InventorID:

2313557 ⎘