Inventor profile of:

Aritomo KIKUCHI

City:

Tokyo

Country:

Japan

Published Applications:

20

Last publication date:

2026-01-22

Top Assignees for applications by Aritomo KIKUCHI

The entities that hold a legal rights for patent applications filed by inventor KIKUCHI Aritomo:

Recent patent applications by KIKUCHI Aritomo

Aritomo KIKUCHI from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-22
US20260023109A1
Physics

BRIDGE BEAM, SEMICONDUCTOR DEVICE HANDLING APPARATUS, AND SEMICONDUCTOR DEVICE TESTING APPARATUS

#2 | 2025-07-03
US20250216443A1
Physics

SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS

#3 | 2025-05-29
US20250172613A1
Physics

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST USING A CARRIER STRUCTURE WITH AN OPENING

#4 | 2025-05-29
US20250172612A1
Physics

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST IN A DEVICE-UNDER-TEST SOCKET

#5 | 2025-05-29
US20250172610A1
Physics

DEVICE HANDLING APPARATUS AND DEVICE TESTING APPARATUS

#6 | 2025-05-29
US20250172600A1
Physics

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST THAT IS TILTED RELATIVE TO A SURFACE OF A CARRIER STRUCTURE

#7 | 2025-03-06
US20250076374A1
Physics

SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS

#8 | 2025-03-06
US20250076367A1
Physics

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM

#9 | 2025-03-06
US20250076366A1
Physics

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM

#10 | 2024-08-29
US20240288491A1
Physics

TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM

#11 | 2023-10-05
US20230314500A1
Physics

TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TEST APPARATUS, AND DUT TEMPERATURE CONTROL METHOD

#12 | 2023-09-21
US20230296666A1
Physics

TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT TEST APPARATUS

#13 | 2021-09-16
US20210285999A1
Physics

Electronic component handling apparatus and electronic component testing apparatus

#14 | 2021-06-24
US20210194601A1
Electricity

Electronic component handling apparatus, electronic component testing apparatus, and socket

#15 | 2021-06-24
US20210190856A1
Physics

Electronic component handling apparatus, electronic component testing apparatus, and socket

#16 | 2019-02-07
US20190041470A1
Physics

Magnetic sensor testing device

#17 | 2018-10-11
US20180294244A1
Electricity

Detector for detecting position of IC device and method for the same

#18 | 2010-12-09
US20100310151A1
Physics

ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE POSITION DETECTION METHOD

#19 | 2009-11-12
US20090278926A1
Physics

Calibration method of electronic device test apparatus

#20 | 2005-11-10
US20050249397A1
Physics

Position detecting apparatus, a position detecting method and an electronic component carrying apparatus

InventorID:

2321346 ⎘