Middletown, Connecticut
United States
36
2014-07-15
The entities that hold a legal rights for patent applications filed by inventor de Groot Peter:
Peter de Groot from Middletown, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Topographical profiling with coherence scanning interferometry
#2 | 2013-05-09Double pass interferometric encoder system
#3 | 2012-08-02Interferometric heterodyne optical encoder system
#4 | 2012-04-12DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRUCTURES
#5 | 2011-02-10Interferometer for determining overlay errors
#6 | 2010-10-21Interferometer and method for measuring characteristics of optically unresolved surface features
#7 | 2010-09-23Error compensation in phase shifting interferometry
#8 | 2010-06-03Interferometer with multiple modes of operation for determining characteristics of an object surface
#9 | 2010-05-27Scan error correction in low coherence scanning interferometry
#10 | 2010-05-27Fiber-based interferometer system for monitoring an imaging interferometer
#11 | 2010-05-27Compound reference interferometer
#12 | 2010-04-15Interferometer system for monitoring an object
#13 | 2009-12-10Interferometry for lateral metrology
#14 | 2009-10-22Interferometer for overlay measurements
#15 | 2009-07-16Analyzing surface structure using scanning interferometry
#16 | 2009-06-11Interferometric analysis of under-resolved features
#17 | 2009-05-21Interferometer utilizing polarization scanning
#18 | 2008-10-30Interferometer and method for measuring characteristics of optically unresolved surface features
#19 | 2008-09-11Method and system for analyzing low-coherence interferometry signals for information about thin film structures
#20 | 2008-07-31Interferometry for lateral metrology
#21 | 2008-07-31Sinusoidal phase shifting interferometry
#22 | 2008-07-24Apparatus and method for measuring characteristics of surface features
#23 | 2008-07-10Interferometer system for monitoring an object
#24 | 2008-04-17Interferometry for determining characteristics of an object surface, with spatially coherent illumination
#25 | 2008-02-28Multiple-angle multiple-wavelength interferometer using high-NA imaging and spectral analysis
#26 | 2008-01-24Compensation of systematic effects in low coherence interferometry
#27 | 2007-09-06Phase shifting interferometry with multiple accumulation
#28 | 2007-07-26Interferometer system for monitoring an object
#29 | 2007-04-19Interferometry method and system including spectral decomposition
#30 | 2007-03-01Interferometer and method for measuring characteristics of optically unresolved surface features
#31 | 2006-11-23Method and system for analyzing low-coherence interferometry signals for information about thin film structures
#32 | 2006-08-24Interferometry systems and methods using spatial carrier fringes
#33 | 2006-07-20Interferometer for determining characteristics of an object surface
#34 | 2006-07-20Interferometer with multiple modes of operation for determining characteristics of an object surface
#35 | 2006-07-20Interferometer for determining characteristics of an object surface, including processing and calibration
#36 | 2005-09-15Interferometry systems and methods
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