Einat Peled

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2024-01-02

Top Assignees for applications by Einat Peled

The entities that hold a legal rights for patent applications filed by inventor Peled Einat:

Einat Peled from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

Reference image grouping in overlay metrology

Overlay measurement using multiple wavelengths

Quick adjustment of metrology measurement parameters according to process variation

Target location in semiconductor manufacturing

InventorID:

2327152 ⎘