Narjes JAVAHERI

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2025-07-24

Top Assignees for applications by Narjes JAVAHERI

The entities that hold a legal rights for patent applications filed by inventor JAVAHERI Narjes:

Narjes JAVAHERI from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

DIGITAL TWIN CALIBRATION

METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE

Metrology method and associated computer product

Metrology parameter determination and metrology recipe selection

Metrology method and apparatus, computer program and lithographic system

Metrology parameter determination and metrology recipe selection

InventorID:

2343958 ⎘