Farzad Farhadzadeh

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2024-12-12

Top Assignees for applications by Farzad Farhadzadeh

The entities that hold a legal rights for patent applications filed by inventor Farhadzadeh Farzad:

ASML Netherlands B.V. 3 Veldhoven, Netherlands
ASML NETHERLANDS B. V. 1 Veldhoven, Netherlands

Recent patent applications by Farhadzadeh Farzad

Farzad Farhadzadeh from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-12-12

US20240412067A1

Physics

Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A Substrate

#2 | 2019-12-12

US20190378012A1

Physics

Metrology apparatus and method for determining a characteristic of one or more structures on a substrate

#3 | 2019-02-21

US20190056220A1

Physics

Metrology method, apparatus and computer program

#4 | 2019-01-03

US20190004437A1

Physics

Metrology parameter determination and metrology recipe selection

InventorID:

2392866 ⎘